Electrical circuit odometer sensor array
Approaches for detecting wear in integrated circuit chips are provided. An on-chip sensor system includes an integrated circuit chip including a plurality of sensor groups. Each respective one of the sensor groups is structured and arranged to detect a measure of wear corresponding to a respective o...
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| Main Authors | , , , , , |
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| Format | Patent |
| Language | English |
| Published |
28.08.2018
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| Subjects | |
| Online Access | Get full text |
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| Abstract | Approaches for detecting wear in integrated circuit chips are provided. An on-chip sensor system includes an integrated circuit chip including a plurality of sensor groups. Each respective one of the sensor groups is structured and arranged to detect a measure of wear corresponding to a respective one of a plurality of failure mechanisms. |
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| AbstractList | Approaches for detecting wear in integrated circuit chips are provided. An on-chip sensor system includes an integrated circuit chip including a plurality of sensor groups. Each respective one of the sensor groups is structured and arranged to detect a measure of wear corresponding to a respective one of a plurality of failure mechanisms. |
| Author | Fry, Jonathan R Klabes, Christopher McGahay, Vincent J Smith, Melissa A Schlichting, Kathryn E Martin, Andrew J |
| Author_xml | – fullname: Fry, Jonathan R – fullname: McGahay, Vincent J – fullname: Smith, Melissa A – fullname: Klabes, Christopher – fullname: Schlichting, Kathryn E – fullname: Martin, Andrew J |
| BookMark | eNrjYmDJy89L5WTQcM1JTS4pykxOzFFIzixKLs0sUchPyc9NLUktUihOzSvOL1JILCpKrORhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfGhwYYGBmYGluYmTkbGxKgBANtGKno |
| ContentType | Patent |
| DBID | EVB |
| DatabaseName | esp@cenet |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Medicine Chemistry Sciences Physics |
| ExternalDocumentID | US10060974B2 |
| GroupedDBID | EVB |
| ID | FETCH-epo_espacenet_US10060974B23 |
| IEDL.DBID | EVB |
| IngestDate | Fri Jul 19 15:04:26 EDT 2024 |
| IsOpenAccess | true |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-epo_espacenet_US10060974B23 |
| Notes | Application Number: US201414574746 |
| OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180828&DB=EPODOC&CC=US&NR=10060974B2 |
| ParticipantIDs | epo_espacenet_US10060974B2 |
| PublicationCentury | 2000 |
| PublicationDate | 20180828 |
| PublicationDateYYYYMMDD | 2018-08-28 |
| PublicationDate_xml | – month: 08 year: 2018 text: 20180828 day: 28 |
| PublicationDecade | 2010 |
| PublicationYear | 2018 |
| RelatedCompanies | INTERNATIONAL BUSINESS MACHINES CORPORATION GLOBALFOUNDRIES INC |
| RelatedCompanies_xml | – name: INTERNATIONAL BUSINESS MACHINES CORPORATION – name: GLOBALFOUNDRIES INC |
| Score | 3.159986 |
| Snippet | Approaches for detecting wear in integrated circuit chips are provided. An on-chip sensor system includes an integrated circuit chip including a plurality of... |
| SourceID | epo |
| SourceType | Open Access Repository |
| SubjectTerms | GYROSCOPIC INSTRUMENTS MEASURING MEASURING DISTANCES, LEVELS OR BEARINGS MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NAVIGATION PHOTOGRAMMETRY OR VIDEOGRAMMETRY PHYSICS SURVEYING TESTING |
| Title | Electrical circuit odometer sensor array |
| URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180828&DB=EPODOC&locale=&CC=US&NR=10060974B2 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5Kfd40KlofRJDgJZimSewlCHlRBNtiG-mtZDcbiGBSNlvEf-_sklovep2FfcwyM9_szgPgLiMIwxEHm1ZuU9OhhWuSHL2UzGN4-_1CtquR0RZjb5Q6zwt30YH3TS6MqhP6qYojokRRlHeh9PVq-4gVqdjK5oGUSKqfkrkfGa133B_KimxGFPjxdBJNQiMM_XRmjF8R61qehdg5QHW9gzD6UUpD_BbIrJTVb5OSHMHuFGerxDF0WKXBQbjpvKbB_kv74a3BnorQpA0SWylsTuA-Vr1rJHt1WnK6LoWO3uWHjGzRG_RLa65nnGdfp3CbxPNwZOLiy5-TLtPZdp-DM-hWdcXOQXcGNkMYkMtS8E5GXeIWnmUXyEvLyRGPXEDv73l6_w1ewqHkmnwktYdX0BV8za7Rygpyo9jzDVl_gBw |
| link.rule.ids | 230,309,783,888,25576,76876 |
| linkProvider | European Patent Office |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT4NAEJ409VFvippaX5gY4oVIKWAvxIRXUFvaWDC9EVggwURogMb4753dUOtFr7PJPmYzM9_szgPgNooRhiMOFqVEJqJCMlWME_RSIi3F2x9mtF0NjbbwNDdQnpfqsgPvm1wYVif0kxVHRIkiKO8N09er7SOWxWIr6_s4R1L56Pi6JbTe8XBMK7IJlqHb85k1MwXT1IOF4L0i1pU0CbGzgep6ByH2A5UG-82gWSmr3ybFOYTdOc5WNEfQSQsOeuam8xoH-9P2w5uDPRahSWoktlJYH8OdzXrXUPbyJK_IOm949C4_aGQLX6NfWlZ8VFXR1wncOLZvuiIuHv6cNAwW232OTqFblEXaB14ZySnCgISWglciosZqpklyhryUlATxyBkM_p5n8N_gNfRcfzoJJ0_eyzkcUA7SB1N5fAHdplqnl2hxm_iKseobhjKDDw |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Electrical+circuit+odometer+sensor+array&rft.inventor=Fry%2C+Jonathan+R&rft.inventor=McGahay%2C+Vincent+J&rft.inventor=Smith%2C+Melissa+A&rft.inventor=Klabes%2C+Christopher&rft.inventor=Schlichting%2C+Kathryn+E&rft.inventor=Martin%2C+Andrew+J&rft.date=2018-08-28&rft.externalDBID=B2&rft.externalDocID=US10060974B2 |