Length stand for probe tester
A length stand for a probe tester, which is adapted to be disposed between a probe of the probe tester and a sustaining surface, is disclosed. The length stand includes a barrel which includes a first edge, a second edge, and at least one observation window. Wherein, the first edge is adapted to be...
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| Main Authors | , |
|---|---|
| Format | Patent |
| Language | Chinese English |
| Published |
11.05.2018
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| Subjects | |
| Online Access | Get full text |
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| Abstract | A length stand for a probe tester, which is adapted to be disposed between a probe of the probe tester and a sustaining surface, is disclosed. The length stand includes a barrel which includes a first edge, a second edge, and at least one observation window. Wherein, the first edge is adapted to be abut against the probe; the second edge is adapted to be abut against the sustaining surface, and a user could observe at least one probe pin of the probe stretching out inside the barrel through the observation window. By utilizing the above length stand, a force for pressing the probe pin and an amount of bouncing back of the probe ping could be fixed and keep at a constant value. |
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| AbstractList | A length stand for a probe tester, which is adapted to be disposed between a probe of the probe tester and a sustaining surface, is disclosed. The length stand includes a barrel which includes a first edge, a second edge, and at least one observation window. Wherein, the first edge is adapted to be abut against the probe; the second edge is adapted to be abut against the sustaining surface, and a user could observe at least one probe pin of the probe stretching out inside the barrel through the observation window. By utilizing the above length stand, a force for pressing the probe pin and an amount of bouncing back of the probe ping could be fixed and keep at a constant value. |
| Author | LI, IING CHU, YUIH |
| Author_xml | – fullname: LI, IING – fullname: CHU, YUIH |
| BookMark | eNrjYmDJy89L5WSQ9UnNSy_JUCguScxLUUjLL1IoKMpPSlUoSS0uSS3iYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxIeG-pmYGBkaGoaHGRCgBAFpPJg4 |
| ContentType | Patent |
| DBID | EVB |
| DatabaseName | esp@cenet |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Medicine Chemistry Sciences Physics |
| ExternalDocumentID | TWM560021UU |
| GroupedDBID | EVB |
| ID | FETCH-epo_espacenet_TWM560021UU3 |
| IEDL.DBID | EVB |
| IngestDate | Fri Jul 19 15:54:37 EDT 2024 |
| IsOpenAccess | true |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | Chinese English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-epo_espacenet_TWM560021UU3 |
| Notes | Application Number: TW20176219208U |
| OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180511&DB=EPODOC&CC=TW&NR=M560021U |
| ParticipantIDs | epo_espacenet_TWM560021UU |
| PublicationCentury | 2000 |
| PublicationDate | 20180511 |
| PublicationDateYYYYMMDD | 2018-05-11 |
| PublicationDate_xml | – month: 05 year: 2018 text: 20180511 day: 11 |
| PublicationDecade | 2010 |
| PublicationYear | 2018 |
| RelatedCompanies | GLOBALWAFERS CO., LTD |
| RelatedCompanies_xml | – name: GLOBALWAFERS CO., LTD |
| Score | 3.2648792 |
| Snippet | A length stand for a probe tester, which is adapted to be disposed between a probe of the probe tester and a sustaining surface, is disclosed. The length stand... |
| SourceID | epo |
| SourceType | Open Access Repository |
| SubjectTerms | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| Title | Length stand for probe tester |
| URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180511&DB=EPODOC&locale=&CC=TW&NR=M560021U |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQMUtONjZOMU3STTS2BHZQjJPMdJMSjcx0Ey2NTdJMjEG9bPBpn35mHqEmXhGmEUwMGbC9MOBzQsvBhyMCc1QyML-XgMvrAsQglgt4bWWxflImUCjf3i3E1kUN2js2tACmMUM1Fydb1wB_F39nNWdn25BwNb8gW19QzW5kGMrMwApsRJuDFn-5hjmB9qQUIFcoboIMbAFAs_JKhBiYqjKEGTidYfeuCTNw-EKnu4UZ2MHrM5OLgYLQPFgswiDrk5qXXpKhAB4EUAC2ORVAl8KkKpSAzzwQZVBwcw1x9tAF2hgP91x8SDjMaaHGYgwswD5_qgSDQpJ5Yloq6DS_ZGCTIcU4ycIS2M8zS0pMA9awQJaxJIMkTmOk8MhJM3CBQgk0_W1oKMPAUlJUmioLrFVLkuTAAQIAQgV7SA |
| link.rule.ids | 230,309,783,888,25578,76884 |
| linkProvider | European Patent Office |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT4NAEJ7U-qg3RRurVjkYbsTQpQgHYlIeQQXaGLC9EZaC9VIbWWPir3d2A-pFb5vZZB-TnZ359vENwJVRFIQsx1TNiYUAhVBDpfnIUHOL6JVOOMoWbJ-xEaT6_WK86MCq_QsjeEI_BDkiWlSB9s7Efr35OcRyxdvK-pq-oOj11k9sV2nQsWbiGtMUd2J7s6k7dRTHsZO5Ej_aEffsIy3dgm0MsE3Osu89TfiflM1vh-IfwM4M21qzQ-h8riToOW3eNQn2oua6W4Jd8T6zqFHY2GB9BMOwXD-zlSwOAWSMOWWeFKaUmeA8OAbZ9xInULHH7HtyWTJvh5aSPnQR85cnINObvCo5m1-BIcOSUNNCnGfQvEIPiyUygMGfzZz-U3cJvSCJwiy8ix_OYJ9rjF-Fa9o5dNnbezlED8vohVDOFzFjfjg |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Length+stand+for+probe+tester&rft.inventor=LI%2C+IING&rft.inventor=CHU%2C+YUIH&rft.date=2018-05-11&rft.externalDBID=U&rft.externalDocID=TWM560021UU |