Length stand for probe tester

A length stand for a probe tester, which is adapted to be disposed between a probe of the probe tester and a sustaining surface, is disclosed. The length stand includes a barrel which includes a first edge, a second edge, and at least one observation window. Wherein, the first edge is adapted to be...

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Bibliographic Details
Main Authors LI, IING, CHU, YUIH
Format Patent
LanguageChinese
English
Published 11.05.2018
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A length stand for a probe tester, which is adapted to be disposed between a probe of the probe tester and a sustaining surface, is disclosed. The length stand includes a barrel which includes a first edge, a second edge, and at least one observation window. Wherein, the first edge is adapted to be abut against the probe; the second edge is adapted to be abut against the sustaining surface, and a user could observe at least one probe pin of the probe stretching out inside the barrel through the observation window. By utilizing the above length stand, a force for pressing the probe pin and an amount of bouncing back of the probe ping could be fixed and keep at a constant value.
Bibliography:Application Number: TW20176219208U