Analog-to-digital converter system and associated calibration method thereof
An analog-to-digital converter (ADC) system includes a main ADC, a reference ADC, a sampling control circuit, and a calibration circuit. The main ADC obtains a first sampled input voltage by sampling an analog input according to a first sampling clock, and performs analog-to-digital conversion upon...
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Format | Patent |
Language | Chinese English |
Published |
01.11.2022
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Online Access | Get full text |
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Abstract | An analog-to-digital converter (ADC) system includes a main ADC, a reference ADC, a sampling control circuit, and a calibration circuit. The main ADC obtains a first sampled input voltage by sampling an analog input according to a first sampling clock, and performs analog-to-digital conversion upon the first sampled voltage to generate a first sample value. The reference ADC obtains a second sampled voltage by sampling the analog input according to a second sampling clock, and performs analog-to-digital conversion upon the second sampled voltage to generate a second sample value. The sampling control circuit controls the second sampling clock to ensure that the second sampling clock and the first sampling clock have a same frequency but different phases, and adjusts the second sample value to generate a reference sample value. The calibration circuit applies calibration to the main ADC according to the first sample value and the reference sample value. |
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AbstractList | An analog-to-digital converter (ADC) system includes a main ADC, a reference ADC, a sampling control circuit, and a calibration circuit. The main ADC obtains a first sampled input voltage by sampling an analog input according to a first sampling clock, and performs analog-to-digital conversion upon the first sampled voltage to generate a first sample value. The reference ADC obtains a second sampled voltage by sampling the analog input according to a second sampling clock, and performs analog-to-digital conversion upon the second sampled voltage to generate a second sample value. The sampling control circuit controls the second sampling clock to ensure that the second sampling clock and the first sampling clock have a same frequency but different phases, and adjusts the second sample value to generate a reference sample value. The calibration circuit applies calibration to the main ADC according to the first sample value and the reference sample value. |
Author | HUANG, SHENG-JUI |
Author_xml | – fullname: HUANG, SHENG-JUI |
BookMark | eNqNyjsKwkAQANAttPB3h7nAFipoWiOKgmXAMoy7k2RhMxN2BsHb23gAq9e8pZuxMC3c48SYpfcmPqY-GWYIwm8qRgX0o0YjIEdAVQkJjSIEzOlV0JIwjGSDRLCBCkm3dvMOs9Lm58rB9dKcb54maUknDMRkbfO8H6vdodrW9f6P8gWagDgu |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
ExternalDocumentID | TWI782681BB |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_TWI782681BB3 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 14:37:16 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | Chinese English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_TWI782681BB3 |
Notes | Application Number: TW202110132081 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221101&DB=EPODOC&CC=TW&NR=I782681B |
ParticipantIDs | epo_espacenet_TWI782681BB |
PublicationCentury | 2000 |
PublicationDate | 20221101 |
PublicationDateYYYYMMDD | 2022-11-01 |
PublicationDate_xml | – month: 11 year: 2022 text: 20221101 day: 01 |
PublicationDecade | 2020 |
PublicationYear | 2022 |
RelatedCompanies | MEDIATEK SINGAPORE PTE. LTD |
RelatedCompanies_xml | – name: MEDIATEK SINGAPORE PTE. LTD |
Score | 3.5644789 |
Snippet | An analog-to-digital converter (ADC) system includes a main ADC, a reference ADC, a sampling control circuit, and a calibration circuit. The main ADC obtains a... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRICITY |
Title | Analog-to-digital converter system and associated calibration method thereof |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221101&DB=EPODOC&locale=&CC=TW&NR=I782681B |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LSwMxEB5qFfWmVbG-yEH2tth9sntYhH1RxT6Q1fZWstmk7WW32BXBX29mH-pFbyGBIflgMjPJzDcAt1qmW4bgXGUpkmqbmalSZtpqmhkONY3BgHEMFEdje_hiPs6teQdWbS1MxRP6UZEjSo1iUt_L6r7e_DxihVVu5fYuXcup4j5OvFBpomMdwxlNCX0vmk7CSaAEgZfMlPGz9yAtoe1o_g7sohONLPvRq481KZvfBiU-gr2plJWXx9D5XPXgIGj7rvVgf9R8d8tho3nbE3hC9pBiqZaFmq2X2OmDVAnjmJFJajpmQvOM0AZunhGJPsbCeBhSN4om6O3xQpwCiaMkGKpyW4tvBBbJrN2_b5xBNy9yfg7EkPo3YCYXFP0CKlydMocJ3RWWZrDU7UP_TzEX_6xdwiFCWVfcXUG3fHvn19L0lulNhdoXI7WLhA |
link.rule.ids | 230,309,786,891,25594,76906 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8MwDLbGQIwbDBDjmQPqrWJ90h4qpLarNthLqLDdqjRNt13aiRUh8euJuxa4wC1KJCv5JMd2Yn8GuFUS1dBSzmUWI6m2nugyZbopx4lmUV3rdhnHQHE0Nvsv-uPcmDdgWdfClDyhHyU5otAoJvS9KO_r9c8jll_mVm7u4pWYyh-C0PGlKjpWMZxRJN91etOJP_Ekz3PCmTR-dgbCEpqW4u7A7j1y86Lj9OpiTcr6t0EJDmFvKmRlxRE0PpdtaHl137U27I-q724xrDRvcwxDZA_JF3KRy8lqgZ0-SJkwjhmZZEvHTGiWEFrBzRMi0MdYGA9Dto2iCXp7PE9PgAS90OvLYlvRNwJROKv372qn0MzyjJ8B0YT-dZnOU4p-AU1tlTKLpaqdGorGYrsDnT_FnP-zdgOtfjgaRsPB-OkCDhDWbfXdJTSLt3d-JcxwEV-XCH4B00qOcQ |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Analog-to-digital+converter+system+and+associated+calibration+method+thereof&rft.inventor=HUANG%2C+SHENG-JUI&rft.date=2022-11-01&rft.externalDBID=B&rft.externalDocID=TWI782681BB |