TWI638987B

A charged particle beam apparatus for processing a tip end portion of a sample into a needle shape, includes an ion beam irradiation unit that irradiates the tip end portion with ion beams, an electron beam irradiation unit that irradiates the tip end portion with electron beams, a secondary electro...

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Main Authors UEMOTO, ATSUSHI, MAN, XIN, ASAHATA, TATSUYA
Format Patent
LanguageChinese
Published 21.10.2018
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Abstract A charged particle beam apparatus for processing a tip end portion of a sample into a needle shape, includes an ion beam irradiation unit that irradiates the tip end portion with ion beams, an electron beam irradiation unit that irradiates the tip end portion with electron beams, a secondary electron detection unit that detects secondary electrons generated at the tip end portion by the irradiation with the electron beams, and an EBSD detection unit that detects diffracted electrons generated at the tip end portion by the irradiation with the electron beams.
AbstractList A charged particle beam apparatus for processing a tip end portion of a sample into a needle shape, includes an ion beam irradiation unit that irradiates the tip end portion with ion beams, an electron beam irradiation unit that irradiates the tip end portion with electron beams, a secondary electron detection unit that detects secondary electrons generated at the tip end portion by the irradiation with the electron beams, and an EBSD detection unit that detects diffracted electrons generated at the tip end portion by the irradiation with the electron beams.
Author ASAHATA, TATSUYA
UEMOTO, ATSUSHI
MAN, XIN
Author_xml – fullname: UEMOTO, ATSUSHI
– fullname: MAN, XIN
– fullname: ASAHATA, TATSUYA
BookMark eNrjYmDJy89L5WTgCgn3NDO2sLQwd-JhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfEIDU7GRCgBAMMtHWo
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID TWI638987BB
GroupedDBID EVB
ID FETCH-epo_espacenet_TWI638987BB3
IEDL.DBID EVB
IngestDate Fri Jul 19 15:32:26 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_TWI638987BB3
Notes Application Number: TW20143128092
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181021&DB=EPODOC&CC=TW&NR=I638987B
ParticipantIDs epo_espacenet_TWI638987BB
PublicationCentury 2000
PublicationDate 20181021
PublicationDateYYYYMMDD 2018-10-21
PublicationDate_xml – month: 10
  year: 2018
  text: 20181021
  day: 21
PublicationDecade 2010
PublicationYear 2018
RelatedCompanies HITACH HIGH-TECH SCIENCE CORPORATION
RelatedCompanies_xml – name: HITACH HIGH-TECH SCIENCE CORPORATION
Score 3.2918954
Snippet A charged particle beam apparatus for processing a tip end portion of a sample into a needle shape, includes an ion beam irradiation unit that irradiates the...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Title TWI638987B
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181021&DB=EPODOC&locale=&CC=TW&NR=I638987B
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSTE2MjazSDLQNUg1N9M1SUkx0E00B52MaJGaZJGUBJQDLx739TPzCDXxijCNYGLIgO2FAZ8TWg4-HBGYo5KB-b0EXF4XIAaxXMBrK4v1kzKBQvn2biG2LmrQ3jGwugLWWWouTrauAf4u_s5qzs62IeFqfkG2nqCa2cLciZmBFdiINgct_nINcwLtSSlArlDcBBnYAoBm5ZUIMTBVZQgzcDrD7l0TZuDwhU53CzOwg9dnJhcDBaF5sFiEgSskHGaNKIOCm2uIs4cu0Ph4uE_iEQqcjMUYWIAd_FQJBgVgpW1qaGyYDNpTAQwtUwuLRMs0c2NLg6QkC1OztCRJBkmcxkjhkZNm4AIFCaikNTKUYWApKSpNlQVWoSVJcmDfAwAMinKF
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSTE2MjazSDLQNUg1N9M1SUkx0E00B52MaJGaZJGUBJQDLx739TPzCDXxijCNYGLIgO2FAZ8TWg4-HBGYo5KB-b0EXF4XIAaxXMBrK4v1kzKBQvn2biG2LmrQ3jGwugLWWWouTrauAf4u_s5qzs62IeFqfkG2nqCa2cLciZmBFdjAtgCdsu8a5gTak1KAXKG4CTKwBQDNyisRYmCqyhBm4HSG3bsmzMDhC53uFmZgB6_PTC4GCkLzYLEIA1dIOMwaUQYFN9cQZw9doPHxcJ_EIxQ4GYsxsAA7-KkSDArAStvU0NgwGbSnAhhaphYWiZZp5saWBklJFqZmaUmSDJI4jZHCIyfPwOkR4usT7-Pp5y3NwAUKHlCpa2Qow8BSUlSaKgusTkuS5MAhAQCSZ3V1
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=TWI638987B&rft.inventor=UEMOTO%2C+ATSUSHI&rft.inventor=MAN%2C+XIN&rft.inventor=ASAHATA%2C+TATSUYA&rft.date=2018-10-21&rft.externalDBID=B&rft.externalDocID=TWI638987BB