Method for measuring sealant strength of lcd panel and measuring apparatus thereof

Saved in:
Bibliographic Details
Main Authors WANG, YOU, HUANG, CHIAO CHUNG, LU, SHI I, TENG, PO WEN, WEI, CHENG LUNG
Format Patent
LanguageChinese
English
Published 01.08.2014
Subjects
Online AccessGet full text

Cover

Loading…
Author WANG, YOU
HUANG, CHIAO CHUNG
LU, SHI I
WEI, CHENG LUNG
TENG, PO WEN
Author_xml – fullname: WANG, YOU
– fullname: HUANG, CHIAO CHUNG
– fullname: LU, SHI I
– fullname: TENG, PO WEN
– fullname: WEI, CHENG LUNG
BookMark eNqNyj0OwjAMBtAMMPB3B1-AqRXdi0AwsKBKjJXVfGkrBTtK3PuzMDAyveVt3UpUsHHPB2xST0EzvcFlybOMVMCRxahYhow2kQaKg6fEgkgs_udySpzZlkI2IUPD3q0Dx4LD152j66U7345I2qMkHiCwvnvd67qpmlPbVn-UD_TbOh0
ContentType Patent
DBID EVB
DatabaseName esp@cenet
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID TWI447376BB
GroupedDBID EVB
ID FETCH-epo_espacenet_TWI447376BB3
IEDL.DBID EVB
IngestDate Fri Jul 19 12:29:08 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_TWI447376BB3
Notes Application Number: TW20110116327
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140801&DB=EPODOC&CC=TW&NR=I447376B
ParticipantIDs epo_espacenet_TWI447376BB
PublicationCentury 2000
PublicationDate 20140801
PublicationDateYYYYMMDD 2014-08-01
PublicationDate_xml – month: 08
  year: 2014
  text: 20140801
  day: 01
PublicationDecade 2010
PublicationYear 2014
RelatedCompanies AU OPTRONICS CORP
RelatedCompanies_xml – name: AU OPTRONICS CORP
Score 3.0600863
SourceID epo
SourceType Open Access Repository
SubjectTerms INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Title Method for measuring sealant strength of lcd panel and measuring apparatus thereof
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140801&DB=EPODOC&locale=&CC=TW&NR=I447376B
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bS8MwFD7MeX3Tqjhv5EH6Vmy3rMWHIvTGFHZhVLe30XSJFWZbbIfgr_c0troXfU1CSA5853xJvnMCcKP3BRJbwWRGj0YjyjXWpbGG0cUSusm6jEmB7MgcPNHHeX_egqTJhZF1Qj9kcUREVIx4L6W_zn8vsTyprSxu2Ss2ZfdBaHtqfTrG0wJ6XNVzbH8y9sau6rp2OFNHU_uBUgux5GzBdkWiqyr7_rNT5aTkmwElOISdCc6VlkfQ-kwU2Hebf9cU2BvWz90K7Ep9ZlxgY43B4himQ_npM0G2Sd7kDR9GH1JIjWJJqtyP9KVMSCbIKl4SBDtfkShdboyNclnwe12Qiv3xTJwACfzQHWi4zMWPRRbhrNmP0zuFdpql_AwI44JzgwnD7N5RYXDGaE_ohtCXSOt0ZnWg8-c05__0XcBBZdpv2dsltMv3Nb_CUFyya2nFLz2jkEU
link.rule.ids 230,309,786,891,25594,76903
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8JAEJ4gPvCmVSM-92B6a2xhofHQmLSFgPIKqcKNsGVXTLAltsTEX-90pMpFr7ubze4k385jv5kBuDFrCg1bJSijx-BTLg1R4aGB2sVWZl1UhCCCbK_eeuIP49q4APM8F4bqhH5QcUREVIh4T-m9Xv4GsXziVia34hWH4vtm4Pj62jtGbwFfXN13ncag7_c93fOcYKT3hk6bcxux5G7Bto0OITlKz26Wk7LcVCjNA9gZ4F5RegiFz7kGJS_vu6bBXnf93a3BLvEzwwQH1xhMjmDYpabPDK1N9kYRPtQ-LCGOYsqy3I_oJZ2zWLFFOGMIdrlg02i2sXa6pILfq4Rl1p-M1TGwZiPwWgYec_IjkUkwyu_jVk-gGMWRPAUmpJLSEsqqV-64sqQQvKpMS5kzNOtMYZeh_Oc2Z__MXUOpFXQ7k06793gO-5mYvylwF1BM31fyEtVyKq5Iol8iJJMv
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Method+for+measuring+sealant+strength+of+lcd+panel+and+measuring+apparatus+thereof&rft.inventor=WANG%2C+YOU&rft.inventor=HUANG%2C+CHIAO+CHUNG&rft.inventor=LU%2C+SHI+I&rft.inventor=TENG%2C+PO+WEN&rft.inventor=WEI%2C+CHENG+LUNG&rft.date=2014-08-01&rft.externalDBID=B&rft.externalDocID=TWI447376BB