Apparatus for planarizing a probe card and method

Saved in:
Bibliographic Details
Main Authors WAKEFIELD, RAY, FOSTER, CRAIG Z
Format Patent
LanguageChinese
English
Published 01.11.2011
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Online AccessGet full text

Cover

Author FOSTER, CRAIG Z
WAKEFIELD, RAY
Author_xml – fullname: WAKEFIELD, RAY
– fullname: FOSTER, CRAIG Z
BookMark eNrjYmDJy89L5WQwdCwoSCxKLCktVkjLL1IoyEnMSyzKrMrMS1dIVCgoyk9KVUhOLEpRSMxLUchNLcnIT-FhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfEh4Z7GpoamRiZOTsZEKAEAJKktJg
ContentType Patent
DBID EVB
DatabaseName esp@cenet
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID TWI351524BB
GroupedDBID EVB
ID FETCH-epo_espacenet_TWI351524BB3
IEDL.DBID EVB
IngestDate Fri Jul 19 12:27:38 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_TWI351524BB3
Notes Application Number: TW20040122605
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111101&DB=EPODOC&CC=TW&NR=I351524B
ParticipantIDs epo_espacenet_TWI351524BB
PublicationCentury 2000
PublicationDate 20111101
PublicationDateYYYYMMDD 2011-11-01
PublicationDate_xml – month: 11
  year: 2011
  text: 20111101
  day: 01
PublicationDecade 2010
PublicationYear 2011
RelatedCompanies NEXTEST SYSTEMS CORPORATION
RelatedCompanies_xml – name: NEXTEST SYSTEMS CORPORATION
Score 2.9315677
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Title Apparatus for planarizing a probe card and method
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111101&DB=EPODOC&locale=&CC=TW&NR=I351524B
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_HzTqji_yIP0rWjbdFsfitAvprAPpLq9jSZpmSBdsR3C_novcVVf9ClwgXBJuPwul9zvAG56piVMl9uGwDuyQbt530hZJgzTznLHEujgMxnvGI66g2f6OHNmLVg0uTCKJ_RDkSOiRXG091qd1-VPECtUfyurW_aKouV9nHihLppwH6KZqYe-F03G4TjQg8BLpvroyXuwEbgt6m_BtiTdkiz70Ysvc1LK34ASH8LOBMcq6iNorRca7AdN3TUN9oab524NdtX_TF6hcGOD1TGY6DhKvu5VRdDhJOVbWuB9d40QRFIi68NkhOO2k7QQ5Ks-9AmQOEqCgYFazL8nPE-mjbq-fQrtYllkZ0CocDhzbYdzim59_47lAhvX6nGLcsFYBzp_DnP-T98FHKhAqUqwu4R2_b7KrhBpa3atFukTMjuDLg
link.rule.ids 230,308,780,885,25564,76547
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_JhvWhXnZx6kb0Xbptv6UIS2K53uC6lub6NJWiZIN2yHsL_ea1zVF30KXCBcEi6_Xy65O4Cbtm4I3eamJvCOrNFW2tFilghNN5PUMgQSfFb6OwbDVvhMH6bWtAbzKhZG5gn9kMkR0aI42nshz-vljxPLl38r81v2iqLFfRA5vioqdx-ima76rtMdj_yRp3qeE03U4ZPTMxG4DepuwXa7rLdbEqcXt4xJWf4GlOAAdsY4VlYcQm09V6DhVXXXFNgbbJ67FdiV_zN5jsKNDeZHoCNxLPN1r3KChJMs3-IM77trhCASk7I-TEI4bjuJM0G-6kMfAwm6kRdqqMXse8KzaFKp65onUM8WWXIKhAqLM9u0OKdI6zt3LBXY2EabG5QLxprQ_HOYs3_6rqERRoP-rN8bPp7DvnSaymC7C6gX76vkElG3YFdywT4BgoyGHw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Apparatus+for+planarizing+a+probe+card+and+method&rft.inventor=WAKEFIELD%2C+RAY&rft.inventor=FOSTER%2C+CRAIG+Z&rft.date=2011-11-01&rft.externalDBID=B&rft.externalDocID=TWI351524BB