Apparatus for planarizing a probe card and method

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Bibliographic Details
Main Authors WAKEFIELD, RAY, FOSTER, CRAIG Z
Format Patent
LanguageChinese
English
Published 01.11.2011
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Bibliography:Application Number: TW20040122605