Stackable semiconductor test system and method for operating same

• Main Authors: WAKEFIELD, RAY, MAGLIOCCO, PAUL, TRUDEAU, PAUL G
• Format: Patent
• Language: English
• Published: 11.02.2005
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more pins than can be accommodated by a single tester. The tester includes a test site with a number of pin...