Apparatus for improved remote microwave plasma source for use with substrate processing systems

An apparatus and methods for an upgraded CVD system providing a remote plasma for efficiently cleaning a chamber, according to a specific embodiment. Etching or depositing a layer onto a substrate also may be achieved using the upgraded CVD system of the present invention. In a specific embodiment,...

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Bibliographic Details
Main Authors ROSE, RONALD L, TSAI, KENNETH, AUGASON, CALVIN R., GUO, JI-TAI, PHAM, QUYEN
Format Patent
LanguageEnglish
Published 21.04.2000
Edition7
Subjects
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Summary:An apparatus and methods for an upgraded CVD system providing a remote plasma for efficiently cleaning a chamber, according to a specific embodiment. Etching or depositing a layer onto a substrate also may be achieved using the upgraded CVD system of the present invention. In a specific embodiment, the present invention provides apparatus for an easily removable, conveniently handled and relatively inexpensive, robust microwave plasma source as a retrofit for or a removable addition to existing CVD apparatus. The present invention provides an improved CVD apparatus or retrofit of existing CVD apparatus capable of producing a remote plasma for efficiently cleaning the chamber.
Bibliography:Application Number: TW19980105891