Computer-readable medium and the method and apparatus for performing scan test on a chip
In an aspect of the disclosure, a method, a computer-readable medium, and an apparatus are provided. The apparatus is used for performing a scan test on a chip. In certain configurations, the apparatus includes an internal voltage source on a same die of the chip. The internal voltage source receive...
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| Main Authors | , |
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| Format | Patent |
| Language | Chinese English |
| Published |
01.08.2024
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| Subjects | |
| Online Access | Get full text |
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| Abstract | In an aspect of the disclosure, a method, a computer-readable medium, and an apparatus are provided. The apparatus is used for performing a scan test on a chip. In certain configurations, the apparatus includes an internal voltage source on a same die of the chip. The internal voltage source receives a constant voltage. The internal voltage source generates an internal voltage based on the constant voltage. The internal voltage is maintained at a lower voltage level in a capture phase of the scan test, and is increased from the lower voltage level to a high voltage level at a start of a shift phase of the scan test and reduced from the high voltage level to the lower voltage level at an end of the shift phase. |
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| AbstractList | In an aspect of the disclosure, a method, a computer-readable medium, and an apparatus are provided. The apparatus is used for performing a scan test on a chip. In certain configurations, the apparatus includes an internal voltage source on a same die of the chip. The internal voltage source receives a constant voltage. The internal voltage source generates an internal voltage based on the constant voltage. The internal voltage is maintained at a lower voltage level in a capture phase of the scan test, and is increased from the lower voltage level to a high voltage level at a start of a shift phase of the scan test and reduced from the high voltage level to the lower voltage level at an end of the shift phase. |
| Author | CHEN, HSINN VARMA, ANSHUL |
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| Snippet | In an aspect of the disclosure, a method, a computer-readable medium, and an apparatus are provided. The apparatus is used for performing a scan test on a... |
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| SubjectTerms | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| Title | Computer-readable medium and the method and apparatus for performing scan test on a chip |
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