Silicon etching solution, method for processing silicon substrate, and method for manufacturing semiconductor device remarkably enhancing the silicon etching rate

The objective of the present invention is to provide a novel etching solution produced by using innovative technology with a high silicon etching rate. The solution is a silicon etching solution comprising an alkaline organic compound and water, which further includes the compound represented by for...

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Main Authors SEIKE, YOSHIKI, HITOMI, TATSUYA, NORO, KOHSUKE
Format Patent
LanguageChinese
English
Published 01.07.2024
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Abstract The objective of the present invention is to provide a novel etching solution produced by using innovative technology with a high silicon etching rate. The solution is a silicon etching solution comprising an alkaline organic compound and water, which further includes the compound represented by formula (1) below, with the content of the compound represented by formula (1) being 100 mass ppm or more. (In formula (1), R1 is a single bond or a hydrocarbon group with 1 - 5 carbon atoms, and R2 and R3 are each independently a hydrogen atom, halogen atom, hydroxyl group, amino group, acetyl group, carboxyl group, silyl group, boron group, cyano group, sulfur group, selenium group, or a hydrocarbon group with 1 - 10 carbon atoms, which may also have substituents.) The pH of the silicon etching solution is between 10.0 and 14.0. In the solution, R1 is a single bond, and R2 and R3 are each independently a hydrogen atom or a hydroxyl group. The alkaline organic compound is a quaternary ammonium hydroxide. A method for
AbstractList The objective of the present invention is to provide a novel etching solution produced by using innovative technology with a high silicon etching rate. The solution is a silicon etching solution comprising an alkaline organic compound and water, which further includes the compound represented by formula (1) below, with the content of the compound represented by formula (1) being 100 mass ppm or more. (In formula (1), R1 is a single bond or a hydrocarbon group with 1 - 5 carbon atoms, and R2 and R3 are each independently a hydrogen atom, halogen atom, hydroxyl group, amino group, acetyl group, carboxyl group, silyl group, boron group, cyano group, sulfur group, selenium group, or a hydrocarbon group with 1 - 10 carbon atoms, which may also have substituents.) The pH of the silicon etching solution is between 10.0 and 14.0. In the solution, R1 is a single bond, and R2 and R3 are each independently a hydrogen atom or a hydroxyl group. The alkaline organic compound is a quaternary ammonium hydroxide. A method for
Author HITOMI, TATSUYA
SEIKE, YOSHIKI
NORO, KOHSUKE
Author_xml – fullname: SEIKE, YOSHIKI
– fullname: HITOMI, TATSUYA
– fullname: NORO, KOHSUKE
BookMark eNqNzr8KwjAQBvAOOvjvHeJeQaIijiKKuwXHciZXG2wuJbkIvo5Pqi1VHJ1u-H583w2THjnCQfI8mcooRwJZlYauIrgqsnGUCotcOi0K50XtncIQ2rzzIV4Ce2BMBZD-xRYoFqA4-tajbbyOit-ZxrtRKDxa8De4VA-BVAKpRnKJ3_bPN83AOOkXUAWcdHeUTA_7bHecYe1yDDUoJOQ8O8u5XMr1aiO3i3_MC4UbWSs
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
ExternalDocumentID TW202427592A
GroupedDBID EVB
ID FETCH-epo_espacenet_TW202427592A3
IEDL.DBID EVB
IngestDate Fri Oct 18 06:05:14 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_TW202427592A3
Notes Application Number: TW202312150471
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240701&DB=EPODOC&CC=TW&NR=202427592A
ParticipantIDs epo_espacenet_TW202427592A
PublicationCentury 2000
PublicationDate 20240701
PublicationDateYYYYMMDD 2024-07-01
PublicationDate_xml – month: 07
  year: 2024
  text: 20240701
  day: 01
PublicationDecade 2020
PublicationYear 2024
RelatedCompanies TOKUYAMA CORPORATION
RelatedCompanies_xml – name: TOKUYAMA CORPORATION
Score 3.6859117
Snippet The objective of the present invention is to provide a novel etching solution produced by using innovative technology with a high silicon etching rate. The...
SourceID epo
SourceType Open Access Repository
SubjectTerms ADHESIVES
ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES
BASIC ELECTRIC ELEMENTS
CANDLES
CHEMISTRY
DETERGENT COMPOSITIONS
DETERGENTS
DYES
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
FATTY ACIDS THEREFROM
MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE
METALLURGY
MISCELLANEOUS APPLICATIONS OF MATERIALS
MISCELLANEOUS COMPOSITIONS
NATURAL RESINS
PAINTS
POLISHES
RECOVERY OF GLYCEROL
RESIN SOAPS
SEMICONDUCTOR DEVICES
SOAP OR SOAP-MAKING
USE OF SINGLE SUBSTANCES AS DETERGENTS
Title Silicon etching solution, method for processing silicon substrate, and method for manufacturing semiconductor device remarkably enhancing the silicon etching rate
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240701&DB=EPODOC&locale=&CC=TW&NR=202427592A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gGvVNUaP4kZoYnlg00G3ugRjZIMREIDqFN9KNNqDSETZi9M_xL_VaNuBF37Zdc-tuva_td1eAKx4KXBchapoTOgaljjACk1UMGlRV3bUdYqik0BZtq_VCH_pmPwdvWS2M7hP6qZsjokaFqO-JttfT1UcsT2Mr4-tgjJeiu6Zf80ppdqzSE8yNvXqt0e14HbfkujW_V2o_aVrFNp3K_QZsYhhtK_hX47WuqlKm6y6luQdbXeQmk33IfY8KsONmO68VYPsx_eGNh6nuxQfw8zzGuUWSKEGjwyHZqimTxTbQBONPMl0A_zU9HR-jbdA9aMuEyeH64AmTc1XZoEsVSaxw8pFUDWCRNuTKhpAZn7DZOws-vgiXI9WcA0di0Ljkns1G3eAQLpsN320Z-LCDpWQHfm8ll-oR5GUk-TEQKpi4QU23HFNQi1qBEFTwoeXcMnT5pn0Cxb_5FP8jnsKuOlngXc8gn8zm_By9ehJc6NfxC4WprCU
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8JADG8QjfimqFH8OhPDE4sGboM9ECMbBJWv6BTelm3sAio3wkaM_jn-pfaODXjRt2Vtult3vba39ncAV77HcF54aGm6pyuU6kxxVaeoULck-q7LHoZKotqiozVf6MNAHaTgLemFkTihnxIcES3KQ3uP5Ho9XW1imbK2Mrx2x3gruG1YVTMfZ8ciPcHc2KxV672u2TXyhlG1-vnOk6QVy6pevNuATQyxKwJnv_5aE10p03WX0tiFrR5K49EepL5HWcgYyclrWdhuxz-88TK2vXAffp7HOLaAE6FodDgkmTUFsjgGmmD8SaaLwn9Jj_lDXBskBm2BOHy4zjxx-Fx0NshWRRKKOvmACwBYpA19sYaQmT9xZu-O-_FFfD4S4BzIiUHjUnoyGvGAA7hs1C2jqeDL2kvN2lZ_pZfSIaR5wP0jIJQ57AYtXdNVRjWquYxR5g81veKgy1fLx5D7W07uP-IFZJpWu2W37juPJ7AjCIva11NIR7O5f4YePnLP5af5BcKNrxU
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Silicon+etching+solution%2C+method+for+processing+silicon+substrate%2C+and+method+for+manufacturing+semiconductor+device+remarkably+enhancing+the+silicon+etching+rate&rft.inventor=SEIKE%2C+YOSHIKI&rft.inventor=HITOMI%2C+TATSUYA&rft.inventor=NORO%2C+KOHSUKE&rft.date=2024-07-01&rft.externalDBID=A&rft.externalDocID=TW202427592A