Method of fabricating semiconductor device

Provided is a method of fabricating a semiconductor device using a curvilinear OPC method. The method of fabricating the semiconductor device includes performing an optical proximity correction (OPC) step on a layout to generate a correction pattern, the correction pattern having a curvilinear shape...

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Bibliographic Details
Main Authors KIM, SANG-WOOK, OH, HEUNG-SUK, HAN, KYU-BIN
Format Patent
LanguageChinese
English
Published 16.06.2023
Subjects
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