Method of fabricating semiconductor device
Provided is a method of fabricating a semiconductor device using a curvilinear OPC method. The method of fabricating the semiconductor device includes performing an optical proximity correction (OPC) step on a layout to generate a correction pattern, the correction pattern having a curvilinear shape...
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Main Authors | , , |
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Format | Patent |
Language | Chinese English |
Published |
16.06.2023
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Subjects | |
Online Access | Get full text |
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