Etching system
A system and method for etching workpieces in a uniform manner are disclosed. Specifically, an etching system is disclosed. The system includes a semiconductor processing system that generates a ribbon ion beam, and a workpiece holder that scans the workpiece through the ribbon ion beam. The workpie...
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Main Authors | , , |
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Format | Patent |
Language | Chinese English |
Published |
16.08.2022
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Subjects | |
Online Access | Get full text |
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