Electrically conductive pins for microcircuit tester

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bott...

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Main Authors WARWICK, BRIAM K, SHERRY, JEFFREY C, ALLADIO, PATRICK J, NELSON, JOHN E, MICHALKO, GARY W, OBERG, RUSSELL F
Format Patent
LanguageChinese
English
Published 16.06.2012
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Abstract The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.
AbstractList The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.
Author OBERG, RUSSELL F
SHERRY, JEFFREY C
ALLADIO, PATRICK J
NELSON, JOHN E
MICHALKO, GARY W
WARWICK, BRIAM K
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– fullname: OBERG, RUSSELL F
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Snippet The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically...
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SubjectTerms MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Title Electrically conductive pins for microcircuit tester
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