A method and system that determines the value of a resistor in linear and non-linear resistor sets
The present invention employs identically sized mirror transistors arrange in groups that may be preferentially addressed and activated to determine the value of a resistor. Known current are directed through the resistor, and the voltage developed is measured by comparing against a reference voltag...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
01.12.2009
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Subjects | |
Online Access | Get full text |
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Summary: | The present invention employs identically sized mirror transistors arrange in groups that may be preferentially addressed and activated to determine the value of a resistor. Known current are directed through the resistor, and the voltage developed is measured by comparing against a reference voltage. The current is increased or decreased by the least significant value until the voltage across the resistor matches the reference voltage. A successive approximation or other known technique may be used instead. A reference current is developed that temperature stable and that is trimmed when manufactured to reduce process effects. The reference voltage may be constructed to be independent form a local power source so that the system is relatively independent of process, voltage and temperature, PVT. |
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Bibliography: | Application Number: TW20090111106 |