Die-level prober

• Main Authors: YEH, CHI-HONG, LIU, SUNG-PIN, HSU, TUNG-JUNG, YANG, CHUANG-MING
• Format: Patent
• Language: Chinese; English
• Published: 01.01.2006
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; SEMICONDUCTOR DEVICES

A die-level prober for testing an unpackaged liquid crystal on silicon (LCOS) display panel includes a tray and a probe card The unpackaged LCOS display panel has at least a first contact pad and a second contact pad. Additionally, the tray includes at least a recession for situating the unpackaged...