Evaluating method and method for manufacturing exposure apparatus
A pattern formation member where a predetermined pattern is formed is placed on a first surface, a photosensitive body having a physical property concerning color such as the color density variable with the amount of energy of an energy beam applied is placed on a second surface, and the pattern is...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
16.08.2003
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Subjects | |
Online Access | Get full text |
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Abstract | A pattern formation member where a predetermined pattern is formed is placed on a first surface, a photosensitive body having a physical property concerning color such as the color density variable with the amount of energy of an energy beam applied is placed on a second surface, and the pattern is transferred to the photosensitive body through a projection optical system by applying an energy beam to the pattern formation member (step 413). The image of the pattern is detected according to the change of the physical property of the photosensitive body, such as the presence/absence of color, and the state of formation of the image of the pattern is extracted according to the results of the detection (step 423). A characteristic of an exposure apparatus is evaluated from the state of formation of the image (step 429). |
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AbstractList | A pattern formation member where a predetermined pattern is formed is placed on a first surface, a photosensitive body having a physical property concerning color such as the color density variable with the amount of energy of an energy beam applied is placed on a second surface, and the pattern is transferred to the photosensitive body through a projection optical system by applying an energy beam to the pattern formation member (step 413). The image of the pattern is detected according to the change of the physical property of the photosensitive body, such as the presence/absence of color, and the state of formation of the image of the pattern is extracted according to the results of the detection (step 423). A characteristic of an exposure apparatus is evaluated from the state of formation of the image (step 429). |
Author | TAKEDA, KANAME HAYASHI, TSUNEHITO |
Author_xml | – fullname: TAKEDA, KANAME – fullname: HAYASHI, TSUNEHITO |
BookMark | eNrjYmDJy89L5WRwdC1LzClNLMnMS1fITS3JyE9RSMxLgTHT8osUchPzStMSk0tKi0BqUisK8otLi1IVEgsKEosSS0qLeRhY0xJzilN5oTQ3g6Kba4izh25qQX58anFBYnJqXmpJfEi4kYGBMQhaOhoTowYAYVQ0Lg |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
ExternalDocumentID | TW200303039A |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_TW200303039A3 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 12:27:57 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | Chinese English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_TW200303039A3 |
Notes | Application Number: TW20020134278 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030816&DB=EPODOC&CC=TW&NR=200303039A |
ParticipantIDs | epo_espacenet_TW200303039A |
PublicationCentury | 2000 |
PublicationDate | 20030816 |
PublicationDateYYYYMMDD | 2003-08-16 |
PublicationDate_xml | – month: 08 year: 2003 text: 20030816 day: 16 |
PublicationDecade | 2000 |
PublicationYear | 2003 |
RelatedCompanies | NIPPON KOGAKU KK |
RelatedCompanies_xml | – name: NIPPON KOGAKU KK |
Score | 2.6781833 |
Snippet | A pattern formation member where a predetermined pattern is formed is placed on a first surface, a photosensitive body having a physical property concerning... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | APPARATUS SPECIALLY ADAPTED THEREFOR CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS |
Title | Evaluating method and method for manufacturing exposure apparatus |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030816&DB=EPODOC&locale=&CC=TW&NR=200303039A |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_HzTquj8oIL0rShbmrUPRba2YwhuQ6rb20jTzA-wLbZF8a_3krXOFyUv4QIhObjcR-5-B3CJRkbUZTIEFlPbJDGLTYaa3LSIoA4llHKhEmRHdPhAbmfWrAGvdS2Mwgn9UOCIKFEc5b1Q73W2CmL5Krcyv4pekJTeDELXN2rvuCP7SBh-3w0mY3_sGZ7nhlNjdL9cw-H01mBdmtESZz947MuqlOy3ShnswsYEd0uKPWh8PWuw7dWd1zTYuqs-vDXYVBmaPEdiJYX5PvSCCqI7edKXHaB1lsT1FK1Q_Y0lpSxZUDWIuvjMUhkI1FmmkL7L_AAuBkHoDU081fyHBfNwurpA5xCaSZqII9BFl1KHW9dU8DZhbce2hcMJ5wv0Y9A2IMfQ-nuf1n-LJ7Cj0tYk-Cs9hWbxXoozVL9FdK749g2vL4m_ |
link.rule.ids | 230,309,786,891,25594,76906 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_JhvOhWdXxWkb0XZsnR9GLK1G1W3bkh1extpGr_ArtgWxb_eS9Y6X5S8hAuE5OByH7n7HcA5GhmByWQILKQtg4QsNBhqcqNJBLUooZQLlSDrUfee3Eyb0xK8FrUwCif0Q4EjokRxlPdUvdfxMojlqNzK5CJ4QdL8qu-3Hb3wjhuyj4TudNu98cgZ2bptt_2J7t0t1nBYnRVYNSU6rzSdHrqyKiX-rVL6W7A2xt2idBtKX89VqNhF57UqbAzzD-8qrKsMTZ4gMZfCZAc6vRyiO3rSFh2gNRaFxRStUO2NRZksWVA1iJr4jOcyEKixWCF9Z8kunPV7vu0aeKrZDwtm_mR5gcYelKN5JPZBEyalFm9eUsHrhNWtVktYnHD-iH4M2gbkAGp_71P7b_EUKq4_HMwG197tIWyqFDYJBEuPoJy-Z-IYVXEanCgefgNJGYys |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Evaluating+method+and+method+for+manufacturing+exposure+apparatus&rft.inventor=TAKEDA%2C+KANAME&rft.inventor=HAYASHI%2C+TSUNEHITO&rft.date=2003-08-16&rft.externalDBID=A&rft.externalDocID=TW200303039A |