THICKNESS MEASURING DEVICE

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Bibliographic Details
Main Authors ZATSEPIN NIKOLAJ N,SU, MALKO IVAN I,SU, SILYUK VIKTOR F,SU, TSUKERMAN VALERIJ L,SU
Format Patent
LanguageEnglish
Published 23.12.1981
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Author MALKO IVAN I,SU
TSUKERMAN VALERIJ L,SU
SILYUK VIKTOR F,SU
ZATSEPIN NIKOLAJ N,SU
Author_xml – fullname: ZATSEPIN NIKOLAJ N,SU
– fullname: MALKO IVAN I,SU
– fullname: SILYUK VIKTOR F,SU
– fullname: TSUKERMAN VALERIJ L,SU
BookMark eNrjYmDJy89L5WSQCvHwdPb2cw0OVvB1dQwODfL0c1dwcQ3zdHblYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxwaEWlkaGlpaOhsaEVQAAjn0hfg
ContentType Patent
DBID EVB
DatabaseName esp@cenet
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID SU892199A1
GroupedDBID EVB
ID FETCH-epo_espacenet_SU892199A13
IEDL.DBID EVB
IngestDate Fri Jul 19 11:25:07 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_SU892199A13
Notes Application Number: SU19782620702
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19811223&DB=EPODOC&CC=SU&NR=892199A1
ParticipantIDs epo_espacenet_SU892199A1
PublicationCentury 1900
PublicationDate 19811223
PublicationDateYYYYMMDD 1981-12-23
PublicationDate_xml – month: 12
  year: 1981
  text: 19811223
  day: 23
PublicationDecade 1980
PublicationYear 1981
RelatedCompanies OTDEL FIZ NERAZRUSHAYUSHCHEGO KONTROLYA AN BSSR
RelatedCompanies_xml – name: OTDEL FIZ NERAZRUSHAYUSHCHEGO KONTROLYA AN BSSR
Score 2.358623
SourceID epo
SourceType Open Access Repository
SubjectTerms MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Title THICKNESS MEASURING DEVICE
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19811223&DB=EPODOC&locale=&CC=SU&NR=892199A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwdV07T8MwED5V5blBAJXyyoCyRYDjBmeIEHUcpaC0FU2qblWdh2ApFQni73M2DbB0PUtn-6TvHvY9AK4lo2Th9Zi9oCUGKOiR2pJQVIbUdTNJSZHrcT7x0I1S-jTrzVrw2tTC6D6hX7o5IiIqQ7zXWl-v_h6xAp1bWd3INyS9P4SJH1j5T7kYQ--BOFbQ98V4FIy4xbk_Sa3hi888hKb3iHHSlnKiVZd9Me2rmpTVf4MSHsD2GHkt60NoFUsD9ngzd82A3Xj93W3Ajs7PzCokrjFYHUE3iQb8Wc3KMGOBWlGlM5iBmA64OIarUCQ8snG7-e_N5pO0OZdzAm2M94sOmLel6ihDvPxeUlqwnJVOjm4SxqrURQDenUJnE5fu5qUz2FfyUZkYxDmHdv3xWVygPa3lpRbFN8B_daQ
link.rule.ids 230,309,786,891,25594,76903
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwdV1LT4NAEJ409VFvippaH-VguBF12VI4EGMXCNhCGwtNb6S8opfaCMa_7-xa1Euvu8ns7iTf7Hy78wC4TQ1KVubAUFe0RIKCHqmaEorGkOp6llJS5KKdTxDqXkyfl4NlC16bXBhRJ_RLFEdERGWI91rY683fI5YtYiuru_QNh94f3ciylfwnXcxA74Foij2ynNnUnjKFMWseK-GLZZgITfMJedLeEAmhIEqLEc9J2fy_UNxj2J-hrHV9Aq1iLUGHNX3XJDgMtt_dEhyI-MyswsEtBqtT6EWez8a8V4YcOGgVeTiDbDsLnzln0HediHkqLpf8niyZx82-tHNoI98vuiDfl7yiDDHzYUppYeRGqeXoJiFXpToC8OECuruk9HZP9aHjRcEkmfjh-BKOuK54VAbRrqBdf3wW13i31umNUMs3ZOF4jg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=THICKNESS+MEASURING+DEVICE&rft.inventor=ZATSEPIN+NIKOLAJ+N%2CSU&rft.inventor=MALKO+IVAN+I%2CSU&rft.inventor=SILYUK+VIKTOR+F%2CSU&rft.inventor=TSUKERMAN+VALERIJ+L%2CSU&rft.date=1981-12-23&rft.externalDBID=A1&rft.externalDocID=SU892199A1