X-RAY DIFFRACTION METHOD OF ANALYZING STRUCTURE DISARRANGEMENTS IN THIN NEAR-SURFACE LAYERS OF CRYSTALS

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Main Authors ZAVYALOVA ANNA A,SU, IMAMOV RAFIK M,SU, PASHAEV ELKHAN M,SU, FEDYUKIN SERGEJ A,SU, KHASHIMOV FARRUKH R,SU, AFANASEV STANISLAV M,SU, LOMOV ANDREJ A,SU, AFANASEV ALEKSANDR M,SU
Format Patent
LanguageEnglish
Russian
Published 15.09.1986
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Author IMAMOV RAFIK M,SU
LOMOV ANDREJ A,SU
FEDYUKIN SERGEJ A,SU
AFANASEV STANISLAV M,SU
KHASHIMOV FARRUKH R,SU
AFANASEV ALEKSANDR M,SU
ZAVYALOVA ANNA A,SU
PASHAEV ELKHAN M,SU
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– fullname: FEDYUKIN SERGEJ A,SU
– fullname: KHASHIMOV FARRUKH R,SU
– fullname: AFANASEV STANISLAV M,SU
– fullname: LOMOV ANDREJ A,SU
– fullname: AFANASEV ALEKSANDR M,SU
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SubjectTerms INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Title X-RAY DIFFRACTION METHOD OF ANALYZING STRUCTURE DISARRANGEMENTS IN THIN NEAR-SURFACE LAYERS OF CRYSTALS
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