X-RAY DIFFRACTION METHOD OF ANALYZING STRUCTURE DISARRANGEMENTS IN THIN NEAR-SURFACE LAYERS OF CRYSTALS
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Main Authors | , , , , , , , |
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Format | Patent |
Language | English Russian |
Published |
15.09.1986
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Subjects | |
Online Access | Get full text |
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Author | IMAMOV RAFIK M,SU LOMOV ANDREJ A,SU FEDYUKIN SERGEJ A,SU AFANASEV STANISLAV M,SU KHASHIMOV FARRUKH R,SU AFANASEV ALEKSANDR M,SU ZAVYALOVA ANNA A,SU PASHAEV ELKHAN M,SU |
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SubjectTerms | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
Title | X-RAY DIFFRACTION METHOD OF ANALYZING STRUCTURE DISARRANGEMENTS IN THIN NEAR-SURFACE LAYERS OF CRYSTALS |
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