INTEGRATED CIRCUIT WITH PROGRAMMABLE LOGIC ANALYZER, ENHANCED ANALYZING AND DEBUGGING CAPABILITIES AND METHOD

An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detection...

Full description

Saved in:
Bibliographic Details
Main Authors BAILEY, JAMES, RAY, CASE, CHRISTOPHER, WILSON, SHARPE, JAMES, PATRICK
Format Patent
LanguageEnglish
Published 28.03.2013
Online AccessGet full text

Cover

More Information
Summary:An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detection, by the logic analyzer, of at least one trigger event; and a built in self test block having a first input for receiving one or more of the signals appearing at the first input of the logic analyzer, a second input coupled to the output of the logic analyzer for selectively enabling the BIST block, the BIST block generating and maintaining a signature based upon the first and second inputs thereof.
Bibliography:Application Number: SG20130011283