DEVICE TO TEST SEMICONDUCTOR STRUCTURES
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
15.11.1994
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Edition | 5 |
Subjects | |
Online Access | Get full text |
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Author | GRYAZEV GENNADIJ F TALUTS ALEKSEJ G TASHIROVA SVETLANA L |
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Author_xml | – fullname: TALUTS ALEKSEJ G – fullname: TASHIROVA SVETLANA L – fullname: GRYAZEV GENNADIJ F |
BookMark | eNrjYmDJy89L5WRQd3EN83R2VQjxVwhxDQ5RCHb19XT293MJdQ7xD1IIDgkCMkKDXIN5GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakl8UKiRgZGxsZG5s6ExEUoApPklmA |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
Edition | 5 |
ExternalDocumentID | RU2023327C1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_RU2023327C13 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 12:30:40 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_RU2023327C13 |
Notes | Application Number: SU19904886821 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19941115&DB=EPODOC&CC=RU&NR=2023327C1 |
ParticipantIDs | epo_espacenet_RU2023327C1 |
PublicationCentury | 1900 |
PublicationDate | 19941115 |
PublicationDateYYYYMMDD | 1994-11-15 |
PublicationDate_xml | – month: 11 year: 1994 text: 19941115 day: 15 |
PublicationDecade | 1990 |
PublicationYear | 1994 |
RelatedCompanies | TALUTS ALEKSEJ GERMANOVICH |
RelatedCompanies_xml | – name: TALUTS ALEKSEJ GERMANOVICH |
Score | 2.440885 |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | DEVICE TO TEST SEMICONDUCTOR STRUCTURES |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19941115&DB=EPODOC&locale=&CC=RU&NR=2023327C1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_GFPVNp-L8Ig9Sn4rQpmn3UIQlLVNYO9p07G10TQZ72Yar-O97Dd30Rd-OBC7Jwe8ul9wHwFPlMuUzVtpOpVyb0iqwA6WZrQYaFaZm2jPV-ccJGxX0febNOrDa58KYOqFfpjgiIqpCvNdGX29_HrGEia3cvSxWOLR5jWUoLNWmi1GErmeJYRhNUpFyi_MwK6wkC5su4a7jc3SUjvAW7TdgiKbDJill-9uixOdwPEFm6_oCOnrdg1O-b7zWg5Nx-9-NZAu93SU8i2j6xiMiUyKjXJK8EWCaiILLNCO5zJAoUJxXQOJI8pGNK84Pp5tnxWFv7jV00enXN0ACqmmpHKUpXaJTshwoXaIvQEu0yWrp0D70_2Rz-8_cHZyZasBNIJt3D93641M_oFmtF49GIN8lHnim |
link.rule.ids | 230,309,783,888,25576,76876 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_GFOebTsX52QepT0Vo0489FGFpS6drO9p07G10TQp72Yar-O97Dd30Rd-OBC7Jwe8ul9wHwFNpWNy2rELTS25ohJSO5nBhaXwoUGEKS5iyOn8UW2FO3ubmvAOrfS6MrBP6JYsjIqJKxHst9fX25xHLk7GVu5flCoc2rwFzPZW36WIEoWuq3sj1p4mXUJVSN83VOHWbLuGGblN0lI7whm03YPBnoyYpZfvbogRncDxFZuv6HDpi3Yce3Tde68NJ1P53I9lCb3cBz54_G1NfYYnC_IwpWSPAJPZyypJUyViKRI7ivAQl8BkNNVxxcTjdIs0PezOuoItOv7gGxSGCFFzngpAKnZJqyEWBvgAp0CbzSicDGPzJ5uafuUfohSyaLCbj-P0WTmVl4CaozbyDbv3xKe7RxNbLBymcb_eke5k |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=DEVICE+TO+TEST+SEMICONDUCTOR+STRUCTURES&rft.inventor=TALUTS+ALEKSEJ+G&rft.inventor=TASHIROVA+SVETLANA+L&rft.inventor=GRYAZEV+GENNADIJ+F&rft.date=1994-11-15&rft.externalDBID=C1&rft.externalDocID=RU2023327C1 |