X-RAY INSPECTION SYSTEM THAT INTEGRATES MANIFEST DATA WITH IMAGING/DETECTION PROCESSING

• Main Authors: ABEL, JEFFREY BRYAN, PARIKH, SHEHUL SAILESH, SANKARANARAYANAN, BALAMURUGAN, KUMAR, SIVA
• Format: Patent
• Language: English; Polish
• Published: 28.09.2018
• Subjects: DETECTING MASSES OR OBJECTS; GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the c...