Dynamic Fault Clustering Method and Apparatus

본 발명은 반도체 메모리의 리던던시를 효과적으로 처리할 수 있는 동적 폴트 클러스터일 방 및 장치를 개시한다. 본 발명의 의해 폴트의 탐색 및 검출하는 콜렉션 동작과 폴트를 적절히 클러스터링하는 동작이 동시에 이루어 질 수 있게 된다. A dynamic fault clustering method and apparatus for efficiently managing redundancy in semiconductor memories performs a collection operation of searching for and detec...

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Main Authors PARK JONG SUN, JEONG JIN HO, BANG SEUNG HWAN, BAE KWAN HO
Format Patent
LanguageEnglish
Korean
Published 11.10.2023
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Abstract 본 발명은 반도체 메모리의 리던던시를 효과적으로 처리할 수 있는 동적 폴트 클러스터일 방 및 장치를 개시한다. 본 발명의 의해 폴트의 탐색 및 검출하는 콜렉션 동작과 폴트를 적절히 클러스터링하는 동작이 동시에 이루어 질 수 있게 된다. A dynamic fault clustering method and apparatus for efficiently managing redundancy in semiconductor memories performs a collection operation of searching for and detecting a fault and an operation of appropriately clustering the fault at the same time, which reduces an amount of time spent performing Built-In Redundancy Analysis (BIRA).
AbstractList 본 발명은 반도체 메모리의 리던던시를 효과적으로 처리할 수 있는 동적 폴트 클러스터일 방 및 장치를 개시한다. 본 발명의 의해 폴트의 탐색 및 검출하는 콜렉션 동작과 폴트를 적절히 클러스터링하는 동작이 동시에 이루어 질 수 있게 된다. A dynamic fault clustering method and apparatus for efficiently managing redundancy in semiconductor memories performs a collection operation of searching for and detecting a fault and an operation of appropriately clustering the fault at the same time, which reduces an amount of time spent performing Built-In Redundancy Analysis (BIRA).
Author BAE KWAN HO
JEONG JIN HO
PARK JONG SUN
BANG SEUNG HWAN
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DocumentTitleAlternate 동적 폴트 클러스터링 방법 및 장치
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Snippet 본 발명은 반도체 메모리의 리던던시를 효과적으로 처리할 수 있는 동적 폴트 클러스터일 방 및 장치를 개시한다. 본 발명의 의해 폴트의 탐색 및 검출하는 콜렉션 동작과 폴트를 적절히 클러스터링하는 동작이 동시에 이루어 질 수 있게 된다. A dynamic fault clustering...
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Title Dynamic Fault Clustering Method and Apparatus
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