SYSTEMS AND METHODS FOR CONCURRENT AND AUTOMATED TESTING OF ZONED NAMESPACE SOLID STATE DRIVES

• Main Authors: YUAN CHI, MALISIC SRDJAN
• Format: Patent
• Language: English; Korean
• Published: 06.12.2022
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

Embodiments of the present invention provide systems and methods for automatically performing DUT testing on a large number of ZNS SSDs in parallel and in accordance with the configuration and restrictions associated with the various zones that comprise the address space of the ZNS SSDs. A computer...