ETCHING METHOD

In etching using a catalyst, the present invention makes it difficult for processing defects to occur. An etching method of an embodiment comprises: preparing a plurality of openings or one or more openings for defining a plurality of island-shaped units in a part for covering a first area on a subs...

Full description

Saved in:
Bibliographic Details
Main Authors HIGUCHI KAZUHITO, OBATA SUSUMU, TAJIMA TAKAYUKI, SANO MITSUO
Format Patent
LanguageEnglish
Korean
Published 27.09.2022
Subjects
Online AccessGet full text

Cover

Loading…
Abstract In etching using a catalyst, the present invention makes it difficult for processing defects to occur. An etching method of an embodiment comprises: preparing a plurality of openings or one or more openings for defining a plurality of island-shaped units in a part for covering a first area on a substrate (10) having first and second areas on a main surface of one side, and allowing a part for covering the second area to form a first layer (90) which is a continuous film; forming a catalyst layer (80) including precious metal on a part exposed in the plurality of opening or the one or more openings of the main surface by using a plating method; covering a part adjacent to a boundary between the first and second areas of the catalyst layer (80) and forming a second layer (95) for exposing a part separated from the boundary of the catalyst layer (80); and etching the substrate (10) with an etching agent including an oxidizing agent and hydrogen fluoride in presence of the catalyst layer (80) and the second layer (95). 본 발명은, 촉매를 사용한 에칭에 있어서, 가공 불량이 생기기 어렵게 한다. 실시 형태의 에칭 방법은, 한쪽 주면에 제1 및 제2 영역을 갖는 기판(10) 상에, 상기 제1 영역을 피복한 부분에 복수의 개구가 또는 복수의 섬상부를 규정하는 하나 이상의 개구가 마련되고, 상기 제2 영역을 피복한 부분은 연속막인 제1층(90)을 형성하는 것과, 귀금속을 포함한 촉매층(80)을 도금법에 의해, 상기 주면 중 상기 복수의 개구 또는 상기 하나 이상의 개구 내에서 노출된 부분 위에 형성하는 것과, 상기 촉매층(80) 중 상기 제1 및 제2 영역간의 경계에 인접한 부분을 피복하고, 상기 촉매층(80) 중 상기 경계로부터 이격된 부분을 노출시킨 제2층(95)을 형성하는 것과, 상기 촉매층(80) 및 상기 제2층(95)의 존재 하에, 산화제와 불화수소를 포함한 에칭제로 상기 기판(10)을 에칭하는 것을 포함한다.
AbstractList In etching using a catalyst, the present invention makes it difficult for processing defects to occur. An etching method of an embodiment comprises: preparing a plurality of openings or one or more openings for defining a plurality of island-shaped units in a part for covering a first area on a substrate (10) having first and second areas on a main surface of one side, and allowing a part for covering the second area to form a first layer (90) which is a continuous film; forming a catalyst layer (80) including precious metal on a part exposed in the plurality of opening or the one or more openings of the main surface by using a plating method; covering a part adjacent to a boundary between the first and second areas of the catalyst layer (80) and forming a second layer (95) for exposing a part separated from the boundary of the catalyst layer (80); and etching the substrate (10) with an etching agent including an oxidizing agent and hydrogen fluoride in presence of the catalyst layer (80) and the second layer (95). 본 발명은, 촉매를 사용한 에칭에 있어서, 가공 불량이 생기기 어렵게 한다. 실시 형태의 에칭 방법은, 한쪽 주면에 제1 및 제2 영역을 갖는 기판(10) 상에, 상기 제1 영역을 피복한 부분에 복수의 개구가 또는 복수의 섬상부를 규정하는 하나 이상의 개구가 마련되고, 상기 제2 영역을 피복한 부분은 연속막인 제1층(90)을 형성하는 것과, 귀금속을 포함한 촉매층(80)을 도금법에 의해, 상기 주면 중 상기 복수의 개구 또는 상기 하나 이상의 개구 내에서 노출된 부분 위에 형성하는 것과, 상기 촉매층(80) 중 상기 제1 및 제2 영역간의 경계에 인접한 부분을 피복하고, 상기 촉매층(80) 중 상기 경계로부터 이격된 부분을 노출시킨 제2층(95)을 형성하는 것과, 상기 촉매층(80) 및 상기 제2층(95)의 존재 하에, 산화제와 불화수소를 포함한 에칭제로 상기 기판(10)을 에칭하는 것을 포함한다.
Author HIGUCHI KAZUHITO
TAJIMA TAKAYUKI
OBATA SUSUMU
SANO MITSUO
Author_xml – fullname: HIGUCHI KAZUHITO
– fullname: OBATA SUSUMU
– fullname: TAJIMA TAKAYUKI
– fullname: SANO MITSUO
BookMark eNrjYmDJy89L5WTgcw1x9vD0c1fwdQ3x8HfhYWBNS8wpTuWF0twMym4gFbqpBfnxqcUFicmpeakl8d5BRgZGRgaGxgampuaOxsSpAgDy4B9o
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
DocumentTitleAlternate 에칭 방법
ExternalDocumentID KR20220130557A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20220130557A3
IEDL.DBID EVB
IngestDate Fri Oct 04 05:00:53 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Korean
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20220130557A3
Notes Application Number: KR20210110813
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220927&DB=EPODOC&CC=KR&NR=20220130557A
ParticipantIDs epo_espacenet_KR20220130557A
PublicationCentury 2000
PublicationDate 20220927
PublicationDateYYYYMMDD 2022-09-27
PublicationDate_xml – month: 09
  year: 2022
  text: 20220927
  day: 27
PublicationDecade 2020
PublicationYear 2022
RelatedCompanies KABUSHIKI KAISHA TOSHIBA
RelatedCompanies_xml – name: KABUSHIKI KAISHA TOSHIBA
Score 3.4033732
Snippet In etching using a catalyst, the present invention makes it difficult for processing defects to occur. An etching method of an embodiment comprises: preparing...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title ETCHING METHOD
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220927&DB=EPODOC&locale=&CC=KR&NR=20220130557A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQMUoxMU5MMjLRNU1LM9A1SUuz1LVIAXZWko2SUoyNkyySjVJAHUVfPzOPUBOvCNMIJoYc2F4Y8Dmh5eDDEYE5KhmY30vA5XUBYhDLBby2slg_KRMolG_vFmLrogbtHRsZGVgamau5ONm6Bvi7-DurOTvbegep-QVB5AxBx1uZOzIzsIIa0qCT9l3DnED7UgqQKxU3QQa2AKB5eSVCDEzZ-cIMnM6wu9eEGTh8oVPeQCY09xWLMPC5hjiDRpcUfF1DPPxdRBmU3UAiukCD4-H-iPcOQnaFsRgDC7CHnyrBoGCWZGZhmmqRnGicDKwxkxKTgJ0ek6RE47RUEyOD1CRTSQYZfCZJ4ZeWZuACcUGLHIzMZRhYSopKU2WBNWlJkhw4AADXsHP0
link.rule.ids 230,309,786,891,25594,76904
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQMUoxMU5MMjLRNU1LM9A1SUuz1LVIAXZWko2SUoyNkyySjVJAHUVfPzOPUBOvCNMIJoYc2F4Y8Dmh5eDDEYE5KhmY30vA5XUBYhDLBby2slg_KRMolG_vFmLrogbtHRsZGVgamau5ONm6Bvi7-DurOTvbegep-QVB5AxBx1uZOzIzsJoDO4Wgk_Zdw5xA-1IKkCsVN0EGtgCgeXklQgxM2fnCDJzOsLvXhBk4fKFT3kAmNPcVizDwuYY4g0aXFHxdQzz8XUQZlN1AIrpAg-Ph_oj3DkJ2hbEYAwuwh58qwaBglmRmYZpqkZxonAysMZMSk4CdHpOkROO0VBMjg9QkU0kGGXwmSeGXlmfg9Ajx9Yn38fTzlmbgAkmBFjwYmcswsJQUlabKAmvVkiQ5cGAAAGkKdt8
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=ETCHING+METHOD&rft.inventor=HIGUCHI+KAZUHITO&rft.inventor=OBATA+SUSUMU&rft.inventor=TAJIMA+TAKAYUKI&rft.inventor=SANO+MITSUO&rft.date=2022-09-27&rft.externalDBID=A&rft.externalDocID=KR20220130557A