SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

Provided are a semiconductor device with an improvement in a yield and operation characteristics, and a manufacturing method thereof. The semiconductor device includes: a gate electrode extended in a first direction, on a substrate; a first external spacer extended along a side of the gate electrode...

Full description

Saved in:
Bibliographic Details
Main Authors PARK SEONG HWA, LEE KWAN HEUM, SEO SO HYUN, YEOM DONG HYUK, KIM JUN KYUM
Format Patent
LanguageEnglish
Korean
Published 27.01.2022
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Provided are a semiconductor device with an improvement in a yield and operation characteristics, and a manufacturing method thereof. The semiconductor device includes: a gate electrode extended in a first direction, on a substrate; a first external spacer extended along a side of the gate electrode; a first active pattern extended in a second direction crossing with the first direction, to penetrate the gate electrode and the first external spacer; an epitaxial pattern connected with the first active pattern, on a side of the first external spacer; a second external spacer interposed in an area between the first external spacer and the epitaxial pattern; and internal spacers interposed between the substrate and the first active pattern and between the gate electrode and the epitaxial pattern, wherein, on a cross section crossing with the second direction, at least one part of the second external spacer covers a side of the first active pattern and a side of the internal spacers. 수율 및 동작 특성이 향상된 반도체 장치 및 그 제조 방법이 제공된다. 반도체 장치는, 기판 상에, 제1 방향으로 연장되는 게이트 전극, 게이트 전극의 측면을 따라 연장되는 제1 외부 스페이서, 제1 방향과 교차하는 제2 방향으로 연장되어 게이트 전극 및 제1 외부 스페이서를 관통하는 제1 활성 패턴, 제1 외부 스페이서의 측면 상에, 제1 활성 패턴과 접속되는 에피택셜 패턴, 제1 외부 스페이서와 에피택셜 패턴 사이의 영역에 개재되는 제2 외부 스페이서, 및 기판과 제1 활성 패턴 사이 및 게이트 전극과 에피택셜 패턴 사이에 개재되는 내부 스페이서를 포함하되, 제2 방향과 교차하는 단면에서, 제2 외부 스페이서의 적어도 일부는 제1 활성 패턴의 측면 및 내부 스페이서의 측면을 덮는다.
AbstractList Provided are a semiconductor device with an improvement in a yield and operation characteristics, and a manufacturing method thereof. The semiconductor device includes: a gate electrode extended in a first direction, on a substrate; a first external spacer extended along a side of the gate electrode; a first active pattern extended in a second direction crossing with the first direction, to penetrate the gate electrode and the first external spacer; an epitaxial pattern connected with the first active pattern, on a side of the first external spacer; a second external spacer interposed in an area between the first external spacer and the epitaxial pattern; and internal spacers interposed between the substrate and the first active pattern and between the gate electrode and the epitaxial pattern, wherein, on a cross section crossing with the second direction, at least one part of the second external spacer covers a side of the first active pattern and a side of the internal spacers. 수율 및 동작 특성이 향상된 반도체 장치 및 그 제조 방법이 제공된다. 반도체 장치는, 기판 상에, 제1 방향으로 연장되는 게이트 전극, 게이트 전극의 측면을 따라 연장되는 제1 외부 스페이서, 제1 방향과 교차하는 제2 방향으로 연장되어 게이트 전극 및 제1 외부 스페이서를 관통하는 제1 활성 패턴, 제1 외부 스페이서의 측면 상에, 제1 활성 패턴과 접속되는 에피택셜 패턴, 제1 외부 스페이서와 에피택셜 패턴 사이의 영역에 개재되는 제2 외부 스페이서, 및 기판과 제1 활성 패턴 사이 및 게이트 전극과 에피택셜 패턴 사이에 개재되는 내부 스페이서를 포함하되, 제2 방향과 교차하는 단면에서, 제2 외부 스페이서의 적어도 일부는 제1 활성 패턴의 측면 및 내부 스페이서의 측면을 덮는다.
Author KIM JUN KYUM
SEO SO HYUN
LEE KWAN HEUM
PARK SEONG HWA
YEOM DONG HYUK
Author_xml – fullname: PARK SEONG HWA
– fullname: LEE KWAN HEUM
– fullname: SEO SO HYUN
– fullname: YEOM DONG HYUK
– fullname: KIM JUN KYUM
BookMark eNrjYmDJy89L5WSwCHb19XT293MJdQ7xD1JwcQ3zdHZVcPRzUfB1DfHwd1FwA4q6OToFeTo7hnj6uSuEeLgqBDv6uvIwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUknjvICMDIyMDA0MDCxNjR2PiVAEA8IUqsA
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
DocumentTitleAlternate 반도체 장치 및 그 제조 방법
ExternalDocumentID KR20220010843A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20220010843A3
IEDL.DBID EVB
IngestDate Fri Jul 19 14:51:52 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Korean
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20220010843A3
Notes Application Number: KR20200089446
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220127&DB=EPODOC&CC=KR&NR=20220010843A
ParticipantIDs epo_espacenet_KR20220010843A
PublicationCentury 2000
PublicationDate 20220127
PublicationDateYYYYMMDD 2022-01-27
PublicationDate_xml – month: 01
  year: 2022
  text: 20220127
  day: 27
PublicationDecade 2020
PublicationYear 2022
RelatedCompanies SAMSUNG ELECTRONICS CO., LTD
RelatedCompanies_xml – name: SAMSUNG ELECTRONICS CO., LTD
Score 3.3341472
Snippet Provided are a semiconductor device with an improvement in a yield and operation characteristics, and a manufacturing method thereof. The semiconductor device...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220127&DB=EPODOC&locale=&CC=KR&NR=20220010843A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_mFPVNp-LHlIDSt2JNW9s-FGmT1OpoO7pu7G30E0RZh6v475vUTfe0tyQHx-Xgch_J7wJwp-hFlVllIeNK02SNuyA5zc1CzqtC1dMiU8xSJIpB-OiPtdepPu3AxxoL0_YJ_W6bI3KLyrm9N-15vfgvYtH2beXyPnvjS_WTl9hUWmXHGIubVIm6NhtGNCISIfYglsL4l8ZzD1NTnR3Y5YG0IeyBTVyBS1lsOhXvCPaGnN-8OYbOe92DA7L-e60H-8HqypsPV9a3PAFzJJQWhXRMkihGlE1eCENOSFHAEj-iiGd0yHPcuEUHh88o8RkaOQE7hVuPJcSXuQizvx3PBvGmvOoZdOf1vDwHlFapzgMuAS_Fmpqa1kNaYVwqRZlnhqpbF9DfxulyO_kKDsVUVBiw0Ydu8_lVXnOf22Q3rap-AFYXfwc
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gGvFNUYOK2kSzt0XsNhkPi9naziFsI2MQ3pZ9JkYDRGb8920nKE-8Nb3kcr3k1_vqXQHuO1pWJL08k3GhqrLKTZAcp3omp0WmaHGWdPRcBIqu9-RM1NeZNqvBx6YXppoT-l0NR-SISjney-q-Xv4nsWj1tnL1kLzxrcWzHRpUWkfHGItKqkQtg4186hOJEGMQSF7wS-Oxh64q5h7scye7K_DAppboS1luGxX7GA5GnN-8PIHa-6IJDbL5e60Jh-665M2Xa_StTkEfC6X5Hp2Q0A8QZdM-Ycj0KHJZ6PgU8YgO2aYVVN3B3gsKHYbGpsvO4M5mIXFkLkL0d-JoEGzLq5xDfb6Y5y1AcRFr3OES7aVYVWK99xgXGOedLE-TrqL1LqC9i9PlbvItNJzQHUbDvje4giNBEtkG3G1Dvfz8yq-5_S2Tm0ptP3bWgfo
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SEMICONDUCTOR+DEVICE+AND+METHOD+FOR+FABRICATING+THE+SAME&rft.inventor=PARK+SEONG+HWA&rft.inventor=LEE+KWAN+HEUM&rft.inventor=SEO+SO+HYUN&rft.inventor=YEOM+DONG+HYUK&rft.inventor=KIM+JUN+KYUM&rft.date=2022-01-27&rft.externalDBID=A&rft.externalDocID=KR20220010843A