SEMICONDUCTOR DEVICE WITH VARYING NUMBERS OF CHANNEL LAYERS AND METHOD OF FABRICATION THEREOF

A method comprises: a step of providing a structure having a front surface and a rear surface, wherein the structure comprises a substrate, two or more semiconductor channel layers, over the substrate, which is connecting a first source/drain (S/D) feature and a second S/D feature, and a gate struct...

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Main Authors CHUNG CHENG TING, CHENG KUAN LUN
Format Patent
LanguageEnglish
Korean
Published 08.12.2021
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Abstract A method comprises: a step of providing a structure having a front surface and a rear surface, wherein the structure comprises a substrate, two or more semiconductor channel layers, over the substrate, which is connecting a first source/drain (S/D) feature and a second S/D feature, and a gate structure engaging the semiconductor channel layer, and the substrate is at a back side of the structure and the gate structure is at a front side of the structure; a step of recessing the first S/D feature to expose a terminal end of one of the semiconductor channel layers; and a step of depositing a dielectric layer over the first S/D feature and covering the exposed termination of one of the semiconductor channel layers. 방법은, 전면 및 후면을 갖는 구조물을 제공하는 단계 - 구조물은 기판, 기판 위에 있고 제1 소스/드레인(source/drain; S/D) 피처와 제2 S/D 피처를 연결하는 2개 이상의 반도체 채널층, 및 반도체 채널층과 맞물리는(engage) 게이트 구조물을 포함하고, 기판은 구조물의 후면에 있고 게이트 구조물은 구조물의 전면에 있음 -; 제1 S/D 피처를 리세싱하여 반도체 채널층 중 하나의 종단부(terminal end)를 노출시키는 단계; 및 제1 S/D 피처 상에 유전체층을 퇴적하고 반도체 채널층 중 하나의 노출된 종단부를 덮는 단계를 포함한다.
AbstractList A method comprises: a step of providing a structure having a front surface and a rear surface, wherein the structure comprises a substrate, two or more semiconductor channel layers, over the substrate, which is connecting a first source/drain (S/D) feature and a second S/D feature, and a gate structure engaging the semiconductor channel layer, and the substrate is at a back side of the structure and the gate structure is at a front side of the structure; a step of recessing the first S/D feature to expose a terminal end of one of the semiconductor channel layers; and a step of depositing a dielectric layer over the first S/D feature and covering the exposed termination of one of the semiconductor channel layers. 방법은, 전면 및 후면을 갖는 구조물을 제공하는 단계 - 구조물은 기판, 기판 위에 있고 제1 소스/드레인(source/drain; S/D) 피처와 제2 S/D 피처를 연결하는 2개 이상의 반도체 채널층, 및 반도체 채널층과 맞물리는(engage) 게이트 구조물을 포함하고, 기판은 구조물의 후면에 있고 게이트 구조물은 구조물의 전면에 있음 -; 제1 S/D 피처를 리세싱하여 반도체 채널층 중 하나의 종단부(terminal end)를 노출시키는 단계; 및 제1 S/D 피처 상에 유전체층을 퇴적하고 반도체 채널층 중 하나의 노출된 종단부를 덮는 단계를 포함한다.
Author CHENG KUAN LUN
CHUNG CHENG TING
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Snippet A method comprises: a step of providing a structure having a front surface and a rear surface, wherein the structure comprises a substrate, two or more...
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SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title SEMICONDUCTOR DEVICE WITH VARYING NUMBERS OF CHANNEL LAYERS AND METHOD OF FABRICATION THEREOF
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