ION BEAM APPARATUS
An objective of the present invention is to provide an ion beam apparatus capable of reducing damage to a sample while switching observation and processing in a short time. As a means to solve the objective of the present invention, the ion beam apparatus switches between an operation mode for irrad...
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Main Authors | , , |
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Format | Patent |
Language | English Korean |
Published |
19.02.2020
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Subjects | |
Online Access | Get full text |
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