A semiconductor device
A semiconductor device comprises a plurality of gates comprising a gate insulation film, a gate electrode, and a first spacer on a substrate and extended in a first direction. First contact plugs are provided to be in contact with a surface of the substrate between the gates and spaced apart from si...
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Main Authors | , , , , , |
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Format | Patent |
Language | English Korean |
Published |
31.01.2020
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Subjects | |
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Abstract | A semiconductor device comprises a plurality of gates comprising a gate insulation film, a gate electrode, and a first spacer on a substrate and extended in a first direction. First contact plugs are provided to be in contact with a surface of the substrate between the gates and spaced apart from sidewalls of the gates. A second contact plug is provided to be positioned between the first contact plugs and in contact with a portion of an upper side of the gate electrode. In addition, an insulation spacer coming in contact with each of sidewalls of the first and second contact plugs is provided in a gap between the first and second contact plugs. Upper sides of the first and second contact plugs are positioned on the same plane. According to the present invention, short circuit of the contact plugs can be prevented.
반도체 소자는, 기판 상에 게이트 절연막, 게이트 전극 및 제1 스페이서를 포함하고 제1 방향으로 연장되는 복수의 게이트들이 구비된다. 상기 게이트들 사이의 기판 표면과 접촉하고, 상기 게이트들의 측벽과 이격되는 제1 콘택 플러그들이 구비된다. 상기 제1 콘택 플러그들 사이에 위치하는 상기 게이트 전극의 상부면의 일부분과 접촉하는 제2 콘택 플러그이 구비된다. 그리고, 상기 제1 및 제2 콘택 플러그들 사이의 갭 내부에, 상기 제1 및 제2 콘택 플러그의 측벽과 각각 접촉하는 절연 스페이서가 구비된다. 상기 제1 및 제2 콘택 플러그의 상부면은 서로 동일한 평면 상에 위치한다. |
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AbstractList | A semiconductor device comprises a plurality of gates comprising a gate insulation film, a gate electrode, and a first spacer on a substrate and extended in a first direction. First contact plugs are provided to be in contact with a surface of the substrate between the gates and spaced apart from sidewalls of the gates. A second contact plug is provided to be positioned between the first contact plugs and in contact with a portion of an upper side of the gate electrode. In addition, an insulation spacer coming in contact with each of sidewalls of the first and second contact plugs is provided in a gap between the first and second contact plugs. Upper sides of the first and second contact plugs are positioned on the same plane. According to the present invention, short circuit of the contact plugs can be prevented.
반도체 소자는, 기판 상에 게이트 절연막, 게이트 전극 및 제1 스페이서를 포함하고 제1 방향으로 연장되는 복수의 게이트들이 구비된다. 상기 게이트들 사이의 기판 표면과 접촉하고, 상기 게이트들의 측벽과 이격되는 제1 콘택 플러그들이 구비된다. 상기 제1 콘택 플러그들 사이에 위치하는 상기 게이트 전극의 상부면의 일부분과 접촉하는 제2 콘택 플러그이 구비된다. 그리고, 상기 제1 및 제2 콘택 플러그들 사이의 갭 내부에, 상기 제1 및 제2 콘택 플러그의 측벽과 각각 접촉하는 절연 스페이서가 구비된다. 상기 제1 및 제2 콘택 플러그의 상부면은 서로 동일한 평면 상에 위치한다. |
Author | AHN HAK YOON OH SEONG HAN LEE SANG HYUN OH YOUNG MOOK BAI KEUN HEE KANG SUNG WOO |
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Title | A semiconductor device |
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