SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD

Provided are a substrate processing apparatus and a substrate processing method, which improve selectivity of etching a silicon nitride layer and suppress precipitation of silicon oxide. According to an embodiment of the present invention, the substrate processing apparatus has a substrate processin...

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Main Authors INADA TAKAO, OHNO HIROKI, SATO HIDEAKI, KAWANO HISASHI, NISHIWAKI YOSHINORI, OTSU TAKAHIKO
Format Patent
LanguageEnglish
Korean
Published 05.04.2019
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Abstract Provided are a substrate processing apparatus and a substrate processing method, which improve selectivity of etching a silicon nitride layer and suppress precipitation of silicon oxide. According to an embodiment of the present invention, the substrate processing apparatus has a substrate processing tank, a phosphoric acid processing liquid supply unit, a circuit, a SiO_2 precipitation preventing agent supply unit, and a mixing unit. The phosphoric acid processing liquid supply unit supplies phosphoric acid processing liquid used for etching processing about the substrate processing tank. The circuit circulates the phosphoric acid processing liquid supplied to the substrate processing tank. The SiO_2 precipitation preventing agent supply unit supplies SiO_2 precipitation preventing agent to the circuit. The mixing unit mixes compounds containing silicon with the phosphoric acid processing liquid before being supplied to the circuit. 실리콘 질화막을 에칭하는 선택성을 향상시키면서, 실리콘 산화물의 석출을 억제하는 기판 처리 장치 및 기판 처리 방법을 제공한다. 실시 형태에 따른 기판 처리 장치는, 기판 처리조와, 인산 처리액 공급부와, 순환로와, SiO석출 방지제 공급부와, 혼합부를 구비한다. 인산 처리액 공급부는 기판 처리조에 있어서의 에칭 처리에서 사용되는 인산 처리액을 공급한다. 순환로는 기판 처리조로 공급된 인산 처리액을 순환시킨다. SiO석출 방지제 공급부는 순환로로 SiO석출 방지제를 공급한다. 혼합부는 순환로로 공급되기 전의 인산 처리액에 실리콘 함유 화합물을 혼합한다.
AbstractList Provided are a substrate processing apparatus and a substrate processing method, which improve selectivity of etching a silicon nitride layer and suppress precipitation of silicon oxide. According to an embodiment of the present invention, the substrate processing apparatus has a substrate processing tank, a phosphoric acid processing liquid supply unit, a circuit, a SiO_2 precipitation preventing agent supply unit, and a mixing unit. The phosphoric acid processing liquid supply unit supplies phosphoric acid processing liquid used for etching processing about the substrate processing tank. The circuit circulates the phosphoric acid processing liquid supplied to the substrate processing tank. The SiO_2 precipitation preventing agent supply unit supplies SiO_2 precipitation preventing agent to the circuit. The mixing unit mixes compounds containing silicon with the phosphoric acid processing liquid before being supplied to the circuit. 실리콘 질화막을 에칭하는 선택성을 향상시키면서, 실리콘 산화물의 석출을 억제하는 기판 처리 장치 및 기판 처리 방법을 제공한다. 실시 형태에 따른 기판 처리 장치는, 기판 처리조와, 인산 처리액 공급부와, 순환로와, SiO석출 방지제 공급부와, 혼합부를 구비한다. 인산 처리액 공급부는 기판 처리조에 있어서의 에칭 처리에서 사용되는 인산 처리액을 공급한다. 순환로는 기판 처리조로 공급된 인산 처리액을 순환시킨다. SiO석출 방지제 공급부는 순환로로 SiO석출 방지제를 공급한다. 혼합부는 순환로로 공급되기 전의 인산 처리액에 실리콘 함유 화합물을 혼합한다.
Author KAWANO HISASHI
NISHIWAKI YOSHINORI
OHNO HIROKI
INADA TAKAO
OTSU TAKAHIKO
SATO HIDEAKI
Author_xml – fullname: INADA TAKAO
– fullname: OHNO HIROKI
– fullname: SATO HIDEAKI
– fullname: KAWANO HISASHI
– fullname: NISHIWAKI YOSHINORI
– fullname: OTSU TAKAHIKO
BookMark eNrjYmDJy89L5WSwCw51Cg4JcgxxVQgI8nd2DQ729HNXcAwIcASKhQYrOPq5KGBV4usa4uHvwsPAmpaYU5zKC6W5GZTdXEOcPXRTC_LjU4sLEpNT81JL4r2DjAwMLQ0MjM0NTY0cjYlTBQBYry00
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
DocumentTitleAlternate 기판 처리 장치 및 기판 처리 방법
ExternalDocumentID KR20190037152A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20190037152A3
IEDL.DBID EVB
IngestDate Fri Jul 19 15:31:05 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Korean
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20190037152A3
Notes Application Number: KR20180115072
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190405&DB=EPODOC&CC=KR&NR=20190037152A
ParticipantIDs epo_espacenet_KR20190037152A
PublicationCentury 2000
PublicationDate 20190405
PublicationDateYYYYMMDD 2019-04-05
PublicationDate_xml – month: 04
  year: 2019
  text: 20190405
  day: 05
PublicationDecade 2010
PublicationYear 2019
RelatedCompanies TOKYO ELECTRON LIMITED
RelatedCompanies_xml – name: TOKYO ELECTRON LIMITED
Score 3.1569128
Snippet Provided are a substrate processing apparatus and a substrate processing method, which improve selectivity of etching a silicon nitride layer and suppress...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190405&DB=EPODOC&locale=&CC=KR&NR=20190037152A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qFfWmVfFRJaDkFpS4m8chSLJJDJY8iKn0VkyaQFGSYiP-fWfXVHuQ3vbFMrvsPL7ZnVmAG4KnotT1UkGxqCmEvs4UU72bKQatqIkQQzNE1HsYacGYPE3opAfvq1gYkSf0SyRHRI4qkN9bIa8Xf04sV7ytXN7mc2xqHvzMcuUOHaN2QwNEdh3LS2I3ZjJj1iiVo_Snj6eno6q9BdtoSOsCtr04PC5lsa5U_APYSXC-uj2E3lszgD22-nttALthd-WNxY77lkfc6eHwP44zT0rSmHFBGD1KdpLY2DZ-luzIlf4dEnpZELvHcO17GQsUJGT6u-7pKF2n-v4E-nVTl6cgoQbRtMIoKkIJIaVqVjSnCA3Kgla6qdIzGG6a6Xxz9wXs86p4nkKH0G8_PstL1LxtfiU27BvKX3-a
link.rule.ids 230,309,783,888,25577,76883
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qFetNq-KjakDJLShxN49DkDyNpnkQU-ktmDQBUZJiI_59J2uqPUhvy8yy7C478-3szgPgiuCpKGS5EFAtSgKhLzNBFW9mgkJLqqKJISks6t0PJHdCHqd02oP3ZSwMyxP6xZIjokTlKO8N09fzv0csi_lWLq6zVyTVd06iWXxnHSO64QWEtwzNjkIrNHnT1LyYD-IfXpuejor6BmziJVthxtKz0calzFdBxdmFrQjHq5o96L3VQxiYy9prQ9j2uy9vbHbSt9hvHz2MtsZxYnNRHJqtIgzuOT2KdKRNnjg9sLh_u_h24obWAVw6dmK6Ak4k_V136sWrs749hH5VV8URcIggkpQreUkoIaQQ1ZJmFE2DIqelrIr0GEbrRjpZz76AgZv443T8EHinsNOymKsKHUG_-fgszhCFm-ycbd437jGCig
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SUBSTRATE+PROCESSING+APPARATUS+AND+SUBSTRATE+PROCESSING+METHOD&rft.inventor=INADA+TAKAO&rft.inventor=OHNO+HIROKI&rft.inventor=SATO+HIDEAKI&rft.inventor=KAWANO+HISASHI&rft.inventor=NISHIWAKI+YOSHINORI&rft.inventor=OTSU+TAKAHIKO&rft.date=2019-04-05&rft.externalDBID=A&rft.externalDocID=KR20190037152A