TEMPERATURE MEASUREMENT CIRCUIT INTEGRATED CIRCUIT AND TEMPERATURE MEASUREMENT METHOD

The present invention relates to a temperature measuring circuit, an integrated circuit, and a temperature measuring method. It is possible to flexibly cope with required accuracy as a temperature sensor. An oscillator (11) generates a clock signal. The oscillator (11) is configured so that relation...

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Main Author MATSUZAKI TOMOKAZU
Format Patent
LanguageEnglish
Korean
Published 23.03.2018
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Abstract The present invention relates to a temperature measuring circuit, an integrated circuit, and a temperature measuring method. It is possible to flexibly cope with required accuracy as a temperature sensor. An oscillator (11) generates a clock signal. The oscillator (11) is configured so that relationship between frequency and temperature of the generated clock signal can be changed. A counter (13) counts the clock signal generated by the oscillator (11) by using a reference signal whose frequency is not changed depending on the temperature. A CPU (16) generates temperature information based on the relationship between the frequency and the temperature of the clock signal in the oscillator (11) and the count value of the counter (13). A control circuit (14) changes the relationship between the frequency and the temperature of the clock signal in the oscillator (11) when the counter (13) overflows. 온도 센서로서 요구 정밀도에 따른 유연한 대응을 행하는 것을 가능하게 한다. 발진기(11)는 클럭 신호를 생성한다. 발진기(11)는 생성하는 클럭 신호의 주파수와 온도의 관계가 변경 가능하게 구성된다. 카운터(13)는 발진기(11)에 의해 생성된 클럭 신호를, 온도에 의존하여 주파수가 변화되지 않는 기준 신호를 사용하여 카운트한다. CPU(16)는, 발진기(11)에 있어서의 클럭 신호의 주파수와 온도 사이의 관계, 및 카운터(13)의 카운트값에 기초하여 온도 정보를 생성한다. 제어 회로(14)는 카운터(13)가 오버플로우한 경우에, 발진기(11)에 있어서의 클럭 신호의 주파수와 온도의 관계를 변화시킨다.
AbstractList The present invention relates to a temperature measuring circuit, an integrated circuit, and a temperature measuring method. It is possible to flexibly cope with required accuracy as a temperature sensor. An oscillator (11) generates a clock signal. The oscillator (11) is configured so that relationship between frequency and temperature of the generated clock signal can be changed. A counter (13) counts the clock signal generated by the oscillator (11) by using a reference signal whose frequency is not changed depending on the temperature. A CPU (16) generates temperature information based on the relationship between the frequency and the temperature of the clock signal in the oscillator (11) and the count value of the counter (13). A control circuit (14) changes the relationship between the frequency and the temperature of the clock signal in the oscillator (11) when the counter (13) overflows. 온도 센서로서 요구 정밀도에 따른 유연한 대응을 행하는 것을 가능하게 한다. 발진기(11)는 클럭 신호를 생성한다. 발진기(11)는 생성하는 클럭 신호의 주파수와 온도의 관계가 변경 가능하게 구성된다. 카운터(13)는 발진기(11)에 의해 생성된 클럭 신호를, 온도에 의존하여 주파수가 변화되지 않는 기준 신호를 사용하여 카운트한다. CPU(16)는, 발진기(11)에 있어서의 클럭 신호의 주파수와 온도 사이의 관계, 및 카운터(13)의 카운트값에 기초하여 온도 정보를 생성한다. 제어 회로(14)는 카운터(13)가 오버플로우한 경우에, 발진기(11)에 있어서의 클럭 신호의 주파수와 온도의 관계를 변화시킨다.
Author MATSUZAKI TOMOKAZU
Author_xml – fullname: MATSUZAKI TOMOKAZU
BookMark eNrjYmDJy89L5WQIDXH1DXANcgwJDXJV8HV1DAbSvq5-IQrOnkHOoZ4hCp5-Ia7uQHlXF7iQo5-LAi5tvq4hHv4uPAysaYk5xam8UJqbQdnNNcTZQze1ID8-tbggMTk1L7Uk3jvIyMDQwsDA2MDExMTRmDhVALRDM5M
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 온도 계측 회로, 집적 회로 및 온도 계측 방법
ExternalDocumentID KR20180030444A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20180030444A3
IEDL.DBID EVB
IngestDate Fri Jul 19 16:53:23 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Korean
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20180030444A3
Notes Application Number: KR20170116605
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180323&DB=EPODOC&CC=KR&NR=20180030444A
ParticipantIDs epo_espacenet_KR20180030444A
PublicationCentury 2000
PublicationDate 20180323
PublicationDateYYYYMMDD 2018-03-23
PublicationDate_xml – month: 03
  year: 2018
  text: 20180323
  day: 23
PublicationDecade 2010
PublicationYear 2018
RelatedCompanies RENESAS ELECTRONICS CORPORATION
RelatedCompanies_xml – name: RENESAS ELECTRONICS CORPORATION
Score 3.0958664
Snippet The present invention relates to a temperature measuring circuit, an integrated circuit, and a temperature measuring method. It is possible to flexibly cope...
SourceID epo
SourceType Open Access Repository
SubjectTerms AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATIONOF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
BASIC ELECTRONIC CIRCUITRY
ELECTRICITY
GENERATION OF NOISE BY SUCH CIRCUITS
GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING,BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN ANON-SWITCHING MANNER
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
Title TEMPERATURE MEASUREMENT CIRCUIT INTEGRATED CIRCUIT AND TEMPERATURE MEASUREMENT METHOD
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20180323&DB=EPODOC&locale=&CC=KR&NR=20180030444A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3da8IwED-c-3zb3GQfbhQ2-lZm27TWBxmaxOmkrZQ6fBPTDxgbKrNj__4umTpf5ksgd-RIApe75H53AXhw7Dy3kqxpYJMZJJ3WDeEQYrhoi_IGcT3RlAnOfuD2RuRl7IxL8LHOhVF1Qr9VcUTUqAT1vVDn9eLvEYspbOXyUbwhaf7UjVtMX92OTa9uW7bOOi0-DFlIdUpbg0gPol-eDAMS0t6DfXSkGxIAxl87Mi9lsW1UuqdwMER5s-IMSu_zChzT9d9rFTjyVyHvChwqjGayROJKD5fnMIq5P-SRwixoPsezMVJV-TXaj-ioH2uy0u0z8jnbkNoB0_4b5vO4F7ILuO_ymPYMnOlkszGTQbS9LLsK5dl8ll2CljbRrxGZaeeeSRzLmyaumU7dxMvyRJiuuILaLknXu9k3cCK7Eoll2TUoF59f2S2a5kLcqR39AT8-iwA
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gfuCbosYP1CWavS2yrZvjgRhoi0PYIMswvBE6tsRogMiM_77XCsiLvPThLr20l9xH27tfAe4dO8usJK0ZOKQGmYyrhnAIMVyMRdkjcT1Rkw3OQej6A_IydIYF-Fj1wiic0G8FjogWlaC958pfz_8usZiqrVw8iDckzZ5acZ3py9Ox6VVty9ZZs877PdajOqX1TqSH0S9PPgMS0tiBXUyyPYm0z1-bsi9lvhlUWkew10d50_wYCu-zMpTo6u-1MhwEyyfvMuyrGs1kgcSlHS5OYBDzoM8jVbOgBRx9Y6RQ-TXajuigHWsS6fYZ-ZytSY2Qaf9NC3js99gp3LV4TH0DVzpaK2bUiTa3ZZ9BcTqbpuegTWqY14jUtDPPJI7ljRPXnIzdxEuzRJiuuIDKNkmX29m3UPLjoDvqtsPOFRxKlqzKsuwKFPPPr_Qaw3QubpR2fwDsto3w
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=TEMPERATURE+MEASUREMENT+CIRCUIT+INTEGRATED+CIRCUIT+AND+TEMPERATURE+MEASUREMENT+METHOD&rft.inventor=MATSUZAKI+TOMOKAZU&rft.date=2018-03-23&rft.externalDBID=A&rft.externalDocID=KR20180030444A