Semiconductor memory device
A semiconductor memory device is provided. The semiconductor memory device includes a static random access memory (SRAM) cell, a sensing circuit connected to the SRAM cell through a first bit line and a second bit line different from the first bit line and sensing data stored in the SRAM cell, and a...
Saved in:
Main Authors | , , , , |
---|---|
Format | Patent |
Language | English Korean |
Published |
28.02.2017
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | A semiconductor memory device is provided. The semiconductor memory device includes a static random access memory (SRAM) cell, a sensing circuit connected to the SRAM cell through a first bit line and a second bit line different from the first bit line and sensing data stored in the SRAM cell, and a bit line voltage regulating circuit which is connected to the SRAM cell through the first and second bit lines and precharges the first bit line with a first voltage lower than a supply voltage, and precharges the second bit line with a different second voltage. So, read operation speed can be improved.
반도체 메모리 장치가 제공된다. 상기 반도체 메모리 장치는, SRAM(Static Random Access Memory) 셀, 제1 비트라인과 상기 제1 비트라인과 다른 제2 비트라인을 통해 상기 SRAM 셀에 접속되고, 상기 SRAM 셀에 저장된 데이터를 센싱하는 센싱 회로, 및 상기 제1 및 제2 비트라인을 통해 상기 SRAM 셀에 접속되고, 상기 제1 비트라인을 공급전압보다 낮은 제1 전압으로 프리차지하고, 상기 제2 비트라인을 상기 공급전압보다 낮고 상기 제1 전압과 다른 제2 전압으로 프리차지하는 비트라인 전압 조절 회로를 포함한다. |
---|---|
AbstractList | A semiconductor memory device is provided. The semiconductor memory device includes a static random access memory (SRAM) cell, a sensing circuit connected to the SRAM cell through a first bit line and a second bit line different from the first bit line and sensing data stored in the SRAM cell, and a bit line voltage regulating circuit which is connected to the SRAM cell through the first and second bit lines and precharges the first bit line with a first voltage lower than a supply voltage, and precharges the second bit line with a different second voltage. So, read operation speed can be improved.
반도체 메모리 장치가 제공된다. 상기 반도체 메모리 장치는, SRAM(Static Random Access Memory) 셀, 제1 비트라인과 상기 제1 비트라인과 다른 제2 비트라인을 통해 상기 SRAM 셀에 접속되고, 상기 SRAM 셀에 저장된 데이터를 센싱하는 센싱 회로, 및 상기 제1 및 제2 비트라인을 통해 상기 SRAM 셀에 접속되고, 상기 제1 비트라인을 공급전압보다 낮은 제1 전압으로 프리차지하고, 상기 제2 비트라인을 상기 공급전압보다 낮고 상기 제1 전압과 다른 제2 전압으로 프리차지하는 비트라인 전압 조절 회로를 포함한다. |
Author | KIM, GYU HONG SONG, TAE JOONG JUNG, SEONG OOK JEONG, HAN WOOL RIM, WOO JIN |
Author_xml | – fullname: SONG, TAE JOONG – fullname: JUNG, SEONG OOK – fullname: KIM, GYU HONG – fullname: RIM, WOO JIN – fullname: JEONG, HAN WOOL |
BookMark | eNrjYmDJy89L5WSQDk7NzUzOz0spTS7JL1LITc3NL6pUSEkty0xO5WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BRgaG5gYGRoamRiaOxsSpAgD4RyY0 |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
DocumentTitleAlternate | 반도체 메모리 장치 |
ExternalDocumentID | KR20170021524A |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_KR20170021524A3 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 14:40:59 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English Korean |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_KR20170021524A3 |
Notes | Application Number: KR20150116014 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170228&DB=EPODOC&CC=KR&NR=20170021524A |
ParticipantIDs | epo_espacenet_KR20170021524A |
PublicationCentury | 2000 |
PublicationDate | 20170228 |
PublicationDateYYYYMMDD | 2017-02-28 |
PublicationDate_xml | – month: 02 year: 2017 text: 20170228 day: 28 |
PublicationDecade | 2010 |
PublicationYear | 2017 |
RelatedCompanies | INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY SAMSUNG ELECTRONICS CO., LTD |
RelatedCompanies_xml | – name: INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY – name: SAMSUNG ELECTRONICS CO., LTD |
Score | 3.0374486 |
Snippet | A semiconductor memory device is provided. The semiconductor memory device includes a static random access memory (SRAM) cell, a sensing circuit connected to... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | INFORMATION STORAGE PHYSICS STATIC STORES |
Title | Semiconductor memory device |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170228&DB=EPODOC&locale=&CC=KR&NR=20170021524A |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSbEwSk1KMjbVNUoENt9MTIF5LsnSKFHXINEsKcXYKNkkCdxR9PUz8wg18YowjWBiyIHthQGfE1oOPhwRmKOSgfm9BFxeFyAGsVzAayuL9ZMygUL59m4hti5q0N6xoTnoOBc1Fydb1wB_F39nNWdnW-8gNb8giBz4ElcTR2YGVmBD2hyUH1zDnED7UgqQKxU3QQa2AKB5eSVCDEzZ-cIMnM6wu9eEGTh8oVPewgzs4DWaycVAQWg-LBZhkA4GrWnPzwMd1ppfpJALWi5bqZCSCsr2ogzKbq4hzh66QPvi4d6L9w5CdpyxGAMLsOOfKsGgkJJimGpskZRonGgC2khvZmFhmZhknGKaBgxH8zSLNEkGGXwmSeGXlmbgAnEh27NlGFhKikpTZYEVbEmSHDhcAIA8fVI |
link.rule.ids | 230,309,783,888,25576,76876 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qfdSbRkVt1YCSW9Dm3UMQmwfRNGmJUXoLu3mAqE1pIuK_d3ebak-9zsDs7sC3M7M7D4CbzJByjGVVlBBx3xSVYA4PJCTeIQ1nspQqmAWKQah5L8rTVJ224GNVC8P6hH6z5ogEUSnBe83u6_n_I5bNciurW_xGSOW9G5u20ETHfZ22cxHsoelMxvbYEizL9CMhjJY8NsRVediCbeJk6xQPzuuQ1qXM142KewA7EyJvVh9C673koGOtZq9xsBc0X94c7LIczbQixAaH1RF0n2lOezmjzVrLBf9J02V_-CynsD-Ga9eJLU8k6yV_x0v8aH1z8gm0SeCfnwKfZf1cNjCSkUIL6TXDGCAsZ2pB9KgXRnEGvU2Szjezr6DjxcEoGT2Gfhf2KWtZqt2Ddr34yi-Isa3xJdPRL4uMgEU |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Semiconductor+memory+device&rft.inventor=SONG%2C+TAE+JOONG&rft.inventor=JUNG%2C+SEONG+OOK&rft.inventor=KIM%2C+GYU+HONG&rft.inventor=RIM%2C+WOO+JIN&rft.inventor=JEONG%2C+HAN+WOOL&rft.date=2017-02-28&rft.externalDBID=A&rft.externalDocID=KR20170021524A |