RAPID RELAY SYSTEM FOR LED INSPECTION APPARATUS

A data relay system for obtaining information at a high speed according to the present invention comprises: a plurality of test units for testing one or more test objects through a pre-programmed technique according to an inputted start command, and generating and outputting test result information...

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Bibliographic Details
Main Author HAN, JOO HUN
Format Patent
LanguageEnglish
Korean
Published 08.06.2015
Subjects
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