RAPID RELAY SYSTEM FOR LED INSPECTION APPARATUS
A data relay system for obtaining information at a high speed according to the present invention comprises: a plurality of test units for testing one or more test objects through a pre-programmed technique according to an inputted start command, and generating and outputting test result information...
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Main Author | |
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Format | Patent |
Language | English Korean |
Published |
08.06.2015
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Subjects | |
Online Access | Get full text |
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