FUNCTION INSPECTION DEVICE OF TCO AND INSPECTION METHOD USING THE SAME

• Main Authors: CHOO, SUNG CHOON, KIM, JONG DAE, CHOI, SUNG HO, KIM, CHANG HAE, LEE, HYANG MOK, LEE, YOUNG MOK
• Format: Patent
• Language: English; Korean
• Published: 08.05.2015
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY; TESTING

The present invention relates to a thermal cut off (TCO) function inspection apparatus and an inspection method using the same. The apparatus comprises a zig in which TCO is mounted by slidingly installing the TCO along with a horizontal direction; a limit switch connected to the moved zig by being...