A METHOD OF CONDUCTING A DIRECTION-SPECIFIC TRIMMING PROCESS FOR CONTACT PATTERNING

The present invention provides a method for manufacturing a semiconductor device. A first layer is formed over a substrate. A patterned second layer is then formed over the first layer. The patterned second layer includes an opening. A spacer material is then deposited in the opening, thereby downsi...

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Bibliographic Details
Main Authors TSAI CHIA SHIUNG, LIU SHIH CHANG, LIU MING CHYI
Format Patent
LanguageEnglish
Korean
Published 24.09.2014
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Summary:The present invention provides a method for manufacturing a semiconductor device. A first layer is formed over a substrate. A patterned second layer is then formed over the first layer. The patterned second layer includes an opening. A spacer material is then deposited in the opening, thereby downsizing the opening in a plurality of directions. A direction-specific trimming process is performed on the spacer material and the second layer. Thereafter, the first layer is patterned with the second layer.
Bibliography:Application Number: KR20130155287