A METHOD OF CONDUCTING A DIRECTION-SPECIFIC TRIMMING PROCESS FOR CONTACT PATTERNING
The present invention provides a method for manufacturing a semiconductor device. A first layer is formed over a substrate. A patterned second layer is then formed over the first layer. The patterned second layer includes an opening. A spacer material is then deposited in the opening, thereby downsi...
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Main Authors | , , |
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Format | Patent |
Language | English Korean |
Published |
24.09.2014
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Subjects | |
Online Access | Get full text |
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Summary: | The present invention provides a method for manufacturing a semiconductor device. A first layer is formed over a substrate. A patterned second layer is then formed over the first layer. The patterned second layer includes an opening. A spacer material is then deposited in the opening, thereby downsizing the opening in a plurality of directions. A direction-specific trimming process is performed on the spacer material and the second layer. Thereafter, the first layer is patterned with the second layer. |
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Bibliography: | Application Number: KR20130155287 |