APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME

Saved in:
Bibliographic Details
Main Authors FUKUMOTO YOSHITO, HAYASHI KAZUSHI, SAKODA NAOKAZU, TAKAMATSU HIROYUKI, INUI MASAHIRO, SUMIE SHINGO
Format Patent
LanguageEnglish
Korean
Published 09.07.2012
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Online AccessGet full text

Cover

Author TAKAMATSU HIROYUKI
INUI MASAHIRO
HAYASHI KAZUSHI
FUKUMOTO YOSHITO
SAKODA NAOKAZU
SUMIE SHINGO
Author_xml – fullname: FUKUMOTO YOSHITO
– fullname: HAYASHI KAZUSHI
– fullname: SAKODA NAOKAZU
– fullname: TAKAMATSU HIROYUKI
– fullname: INUI MASAHIRO
– fullname: SUMIE SHINGO
BookMark eNrjYmDJy89L5WRwdAwIcAxyDAkNVnD0c1HwdQ3x8HdRcPMPAjIdg0ODPP3cFYJdfT2d_f1cQp1DgOLOjkFBnq5BCj6ebq4hnr6uPAysaYk5xam8UJqbQRko4eyhm1qQH59aXJCYnJqXWhLvHWRkYGhkYGBuZmJk6WhMnCoArM4tsQ
ContentType Patent
DBID EVB
DatabaseName esp@cenet
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID KR20120076429A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20120076429A3
IEDL.DBID EVB
IngestDate Fri Jul 19 11:28:49 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Korean
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20120076429A3
Notes Application Number: KR20127011662
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120709&DB=EPODOC&CC=KR&NR=20120076429A
ParticipantIDs epo_espacenet_KR20120076429A
PublicationCentury 2000
PublicationDate 20120709
PublicationDateYYYYMMDD 2012-07-09
PublicationDate_xml – month: 07
  year: 2012
  text: 20120709
  day: 09
PublicationDecade 2010
PublicationYear 2012
RelatedCompanies KOBELCO RESEARCH INSTITUTE, INC
KABUSHIKI KAISHA KOBE SEIKO SHO
RelatedCompanies_xml – name: KOBELCO RESEARCH INSTITUTE, INC
– name: KABUSHIKI KAISHA KOBE SEIKO SHO
Score 2.8352852
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Title APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120709&DB=EPODOC&locale=&CC=KR&NR=20120076429A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gfr4pavxAs0Szt0W3lbE9EFPWERD3kTIMb4RuIzEaIDLjv--1gvLEW3tNLu2ld71rf3cFuJ_aInsUxDZy0vQM0jBdQz7nGEQ4bm5OJ5ZwZTZyGDndIXkeNUYV-Fjnwqg6od-qOCJqVIb6Xip7vfi_xGIKW7l8EG9Imj910hbTV9GxaeEO9nTWbgVJzGJf9_1Wn-sR_x3DmB3NL92BXXSkXQkADF7bMi9lsXmodI5hL0F-s_IEKu_zGhz667_XanAQrp68a7CvMJrZEokrPVyeAqVJQjlNhwONRkwLg7QbMw0DOmyioZQIB20gJRxHbOinSPcp572Aay-9TpD2wuAM7rDhdw2c1fhPCOM-31yCfQ7V2XxWXICGKjVx0K2yRI6-TdMVbuGYGfHswiNm3pheQn0bp6vtw9dwJLsKoOrVoVp-fhU3eAyX4lZJ7wfwY4Pb
link.rule.ids 230,309,786,891,25585,76894
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1dT8Iw8IL4gW-KGj9Ql2j2tuhYGdsDMWUd2YR9ZAzDG6HbSIwGiMz4971WUJ94u9wll_bS-2rvrgD3M4Nnj5wYWk7atkZauqWJ5xyNcNPK9dm0yS3RjRyEpjciz-PWuALvm14YOSf0Sw5HRI3KUN9Laa-Xf5dYTNZWrh74K6IWT720w9R1dqw38QTbKut23DhikaM6TqefqGHyQ8OcHc0v3YFdDLJtMWnffemKvpTlf6fSO4K9GPnNy2OovC3qUHM2f6_V4SBYP3nXYV_WaGYrRK71cHUClMYxTWg6Gio0ZErgpl7EFEzoEERDKSoclKGQcBSykZMi3qFJ4ruJMvB7buoH7incIeB4Gq5q8iuEST_5vwXjDKrzxbw4BwVVampiWNXkOcY2bYtbhalnxDYKm-h5a3YBjW2cLreTb6HmpcFgMvDD_hUcCpIsVrUbUC0_PotrdMklv5GS_AZLkYbO
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=APPARATUS+AND+METHOD+FOR+MEASURING+SEMICONDUCTOR+CARRIER+LIFETIME&rft.inventor=FUKUMOTO+YOSHITO&rft.inventor=HAYASHI+KAZUSHI&rft.inventor=SAKODA+NAOKAZU&rft.inventor=TAKAMATSU+HIROYUKI&rft.inventor=INUI+MASAHIRO&rft.inventor=SUMIE+SHINGO&rft.date=2012-07-09&rft.externalDBID=A&rft.externalDocID=KR20120076429A