APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME
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Main Authors | , , , , , |
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Format | Patent |
Language | English Korean |
Published |
09.07.2012
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Subjects | |
Online Access | Get full text |
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Author | TAKAMATSU HIROYUKI INUI MASAHIRO HAYASHI KAZUSHI FUKUMOTO YOSHITO SAKODA NAOKAZU SUMIE SHINGO |
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RelatedCompanies | KOBELCO RESEARCH INSTITUTE, INC KABUSHIKI KAISHA KOBE SEIKO SHO |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING |
Title | APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME |
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