DISPLAY DEVICE AND METHOD OF TESTING THE SAME
PURPOSE: A display device and an inspection method thereof are provided to inspect a mounting fault of a driving circuit unit by an inspection pad. CONSTITUTION: Inspection pads(141~144) are located on a peripheral area of a substrate(114). Main pins(156,158) are connected to pixel cells. Dummy pins...
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Main Authors | , , |
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Format | Patent |
Language | English Korean |
Published |
05.07.2012
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Subjects | |
Online Access | Get full text |
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Summary: | PURPOSE: A display device and an inspection method thereof are provided to inspect a mounting fault of a driving circuit unit by an inspection pad. CONSTITUTION: Inspection pads(141~144) are located on a peripheral area of a substrate(114). Main pins(156,158) are connected to pixel cells. Dummy pins(151~154) are connected to the inspection pads respectively. Visual inspection lines(166,168) are arranged on the peripheral area of the substrate. The visual inspection lines include a first portion connected to the main pins and a second portion connected to the inspection pads. The first and second portions are disconnected each other. |
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Bibliography: | Application Number: KR20100135627 |