X-RAY DETECTOR
PURPOSE: An X-ray detector is provided to implement a high fill factor by maximizing the arrangement area of a pin diode used as an optical sensor. CONSTITUTION: A gate line connected to a gate electrode(124) is formed on a substrate(110). A gate insulating layer(140) is formed on the upper side of...
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Format | Patent |
Language | English Korean |
Published |
24.06.2011
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Subjects | |
Online Access | Get full text |
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Abstract | PURPOSE: An X-ray detector is provided to implement a high fill factor by maximizing the arrangement area of a pin diode used as an optical sensor. CONSTITUTION: A gate line connected to a gate electrode(124) is formed on a substrate(110). A gate insulating layer(140) is formed on the upper side of the gate electrode and the gate line. A semiconductor layer(154) is laminated on a part of the gate insulating layer. A data line includes a source electrode(173) to cover a first part of the semiconductor layer. A resistive contact member(163) is formed on the semiconductor layer. |
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AbstractList | PURPOSE: An X-ray detector is provided to implement a high fill factor by maximizing the arrangement area of a pin diode used as an optical sensor. CONSTITUTION: A gate line connected to a gate electrode(124) is formed on a substrate(110). A gate insulating layer(140) is formed on the upper side of the gate electrode and the gate line. A semiconductor layer(154) is laminated on a part of the gate insulating layer. A data line includes a source electrode(173) to cover a first part of the semiconductor layer. A resistive contact member(163) is formed on the semiconductor layer. |
Author | KIM, DONG HYUK JUNG, KWAN WOOK |
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Notes | Application Number: KR20090127307 |
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Snippet | PURPOSE: An X-ray detector is provided to implement a high fill factor by maximizing the arrangement area of a pin diode used as an optical sensor.... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | X-RAY DETECTOR |
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