PROBE AND PROBE CARD HAVING THE SAME

PURPOSE: A probe and a probe card including the same are provided to protect a probe connector from an external shock by forming a space and prevent a signal error due to heat and external shock by including a heat radiating device. CONSTITUTION: A printed circuit board(100) includes a circuit patte...

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Bibliographic Details
Main Authors YU, JEONG HEE, JEON, BYOUNG IL, JU, YOUNG HUN
Format Patent
LanguageEnglish
Published 17.02.2010
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PURPOSE: A probe and a probe card including the same are provided to protect a probe connector from an external shock by forming a space and prevent a signal error due to heat and external shock by including a heat radiating device. CONSTITUTION: A printed circuit board(100) includes a circuit pattern, a through hole and a terminal connected to the circuit pattern. A slit guide(300) is placed on the low side of the printed circuit board, and includes a plurality of slits formed in a penetration area and the low side of the slit guide. An insertion part(410) is inserted into the slits. A connection part(470) passes through the penetration area and the through hole and is connected to the terminal. A tip part(460) is expanded downward from the insertion part.
Bibliography:Application Number: KR20080076836