METALIZED ELASTOMERIC PROBE STRUCTURE

• Main Authors: HOUGHAM GARETH GEOFFREY, COTEUS PAUL W, LANZETTA ALPHONSO P, GOMA SHERIF A, MORRIS DANIEL PETER, CORDES STEVEN ALLEN, ROSNER JOANNA, AFZALI ALI, FARINELLI MATTHEW J, YOHANNAN NISHA
• Format: Patent
• Language: English
• Published: 06.09.2007
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; SEMICONDUCTOR DEVICES

A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer run...