METALIZED ELASTOMERIC PROBE STRUCTURE

A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer run...

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Main Authors HOUGHAM GARETH GEOFFREY, COTEUS PAUL W, LANZETTA ALPHONSO P, GOMA SHERIF A, MORRIS DANIEL PETER, CORDES STEVEN ALLEN, ROSNER JOANNA, AFZALI ALI, FARINELLI MATTHEW J, YOHANNAN NISHA
Format Patent
LanguageEnglish
Published 06.09.2007
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Abstract A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier. The probe structure includes one or more other contact structures adapted for connection to a test apparatus.
AbstractList A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier. The probe structure includes one or more other contact structures adapted for connection to a test apparatus.
Author COTEUS PAUL W
HOUGHAM GARETH GEOFFREY
FARINELLI MATTHEW J
AFZALI ALI
GOMA SHERIF A
ROSNER JOANNA
LANZETTA ALPHONSO P
YOHANNAN NISHA
MORRIS DANIEL PETER
CORDES STEVEN ALLEN
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– fullname: LANZETTA ALPHONSO P
– fullname: GOMA SHERIF A
– fullname: MORRIS DANIEL PETER
– fullname: CORDES STEVEN ALLEN
– fullname: ROSNER JOANNA
– fullname: AFZALI ALI
– fullname: FARINELLI MATTHEW J
– fullname: YOHANNAN NISHA
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Snippet A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more...
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SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title METALIZED ELASTOMERIC PROBE STRUCTURE
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