POLYMER RESIN FOR UNDERFILL COMPOSITION OF IC ASSEMBLY EXHIBITING SUBSTANTIALLY NO VOLUME CHANGES DURING CURING PROCESS, AND ELECTRONIC DEVICE USING THE SAME TO IMPROVE STRESS CAUSED BY DIFFERENT COEFFICIENT OF TEMPERATURE EXPANSION

PURPOSE: A polymer resin for an underfill composition of an IC assembly is provided to make substantially no changes in the resulted underfill volume during a curing process, and an electronic device using the same is provided to improve stress caused by different coefficient of temperature expansio...

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Main Authors LAMOLA ANGELO, BRESE NATHANIEL E
Format Patent
LanguageEnglish
Korean
Published 12.10.2004
Edition7
Subjects
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Abstract PURPOSE: A polymer resin for an underfill composition of an IC assembly is provided to make substantially no changes in the resulted underfill volume during a curing process, and an electronic device using the same is provided to improve stress caused by different coefficient of temperature expansion (CTE) in IC, carrier and solder joint. CONSTITUTION: The polymer resin for an underfill of an IC assembly, which can be a remoldable polymer resin, comprises at least one dienophile and at least one diene as polymerization units, wherein the diene is possible to undergo Diels-Alder reaction and contains at least one pair of conjugated double bonds having at least one hydrogen on the carbon atoms at the position of 1 or 4. The electronic device comprises an encapsulated IC assembly, which comprises: an integrated circuit(5) which is attached to a carrier board(15) through a multiple of metal joints(10) that form a gap(7) between the carrier board and the circuit; and an underfill material(30) comprised of the polymer resin and a binder selected from polycyclosiloxane.
AbstractList PURPOSE: A polymer resin for an underfill composition of an IC assembly is provided to make substantially no changes in the resulted underfill volume during a curing process, and an electronic device using the same is provided to improve stress caused by different coefficient of temperature expansion (CTE) in IC, carrier and solder joint. CONSTITUTION: The polymer resin for an underfill of an IC assembly, which can be a remoldable polymer resin, comprises at least one dienophile and at least one diene as polymerization units, wherein the diene is possible to undergo Diels-Alder reaction and contains at least one pair of conjugated double bonds having at least one hydrogen on the carbon atoms at the position of 1 or 4. The electronic device comprises an encapsulated IC assembly, which comprises: an integrated circuit(5) which is attached to a carrier board(15) through a multiple of metal joints(10) that form a gap(7) between the carrier board and the circuit; and an underfill material(30) comprised of the polymer resin and a binder selected from polycyclosiloxane.
Author LAMOLA ANGELO
BRESE NATHANIEL E
Author_xml – fullname: LAMOLA ANGELO
– fullname: BRESE NATHANIEL E
BookMark eNqNj8tKBEEMRXuhC1__EHCr0D6Q2VZXpaaD9SKpauzVMEi5kp6B8aP9DKvRD3B1E-7N5eSyO1sOS73ovlN0s0cGRqEANjKUYJAtOQc6-hSFMsUA0QJpUCLoBzcDvo00NCdsQcogWYVMyjUjRJiiKx5BjypsUcAUXmP6VxJHjSJ3oIIBdKgzx9CaDU6kEYqsoTwiiGodOQL5djK1PTdEAa2KoIFhBkPWImPIjROtJU3r3Dgz-oSscmFsnEkFaQ9cd-cf-89TvfnTq-7WYtbjfT0edvV03L_XpX7tXvmx75_7fvOyeejV0_9SP7ZZW7A
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Edition 7
ExternalDocumentID KR20040086810A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20040086810A3
IEDL.DBID EVB
IngestDate Fri Jul 19 16:03:37 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Korean
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20040086810A3
Notes Application Number: KR20040022843
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041012&DB=EPODOC&CC=KR&NR=20040086810A
ParticipantIDs epo_espacenet_KR20040086810A
PublicationCentury 2000
PublicationDate 20041012
PublicationDateYYYYMMDD 2004-10-12
PublicationDate_xml – month: 10
  year: 2004
  text: 20041012
  day: 12
PublicationDecade 2000
PublicationYear 2004
RelatedCompanies ROHM AND HAAS ELECTRONIC MATERIALS, L.L.C
RelatedCompanies_xml – name: ROHM AND HAAS ELECTRONIC MATERIALS, L.L.C
Score 2.5874817
Snippet PURPOSE: A polymer resin for an underfill composition of an IC assembly is provided to make substantially no changes in the resulted underfill volume during a...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
CHEMISTRY
COMPOSITIONS BASED THEREON
COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVINGCARBON-TO-CARBON UNSATURATED BONDS
METALLURGY
ORGANIC MACROMOLECULAR COMPOUNDS
SEMICONDUCTOR DEVICES
THEIR PREPARATION OR CHEMICAL WORKING-UP
Title POLYMER RESIN FOR UNDERFILL COMPOSITION OF IC ASSEMBLY EXHIBITING SUBSTANTIALLY NO VOLUME CHANGES DURING CURING PROCESS, AND ELECTRONIC DEVICE USING THE SAME TO IMPROVE STRESS CAUSED BY DIFFERENT COEFFICIENT OF TEMPERATURE EXPANSION
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20041012&DB=EPODOC&locale=&CC=KR&NR=20040086810A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1RT9swELaAIcbbxkDbYNNJQ31aBVETGh4q5NiXxpDYUeJU7RMitJEmUItGEX95P2PnQIEnnhLnlNPpTmd_Z9-dGTusPUKhPc_rNi7xya_DoBsSUO4GtDTRqN_0p64aOdMnSeWfj4PxGrtd1cK0fUIf2-aI5FHX5O_Ldr6-e93Ekm1u5f1R_Yc-Lc5iO5CdVXTsu3ZVHRkNMDfSiI4Qg4uio4uW5uB76B3zdfbBAWnXaR9HkatLuXu7qMSf2GZO_ObLz2ztZrHDPorV3Ws7bCt7PvKm12fvu__C_uUmnWRYAGlNaaD4DdoagZgichAmy02p3I4TmBiUAF6WmEXpBHCcqIgoeghlFZWWa6t4SgRtYGTSKkMQCddDLEFWLjsCxNMjL4wgA_0GriVgisIWRhNniSMlENyVHUOwCULJiYc1oDL6ZURj6wwLglclSogmIFUcY4HakpwEjZXb2rJOTotZjkWbfEFy5ly7yX2X_YrRiqRLKrt8sdDlRfFWv709tjFfzGdfGTT1tR_0e1eE4mp_duIROgqbsJl6U_-4CU6n39jBe5y-v0_eZ9tPfRddgskB21j-fZj9IIywrH-2pv0PF3uumQ
link.rule.ids 230,309,786,891,25594,76903
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1RT9swELYYTGNvwDbBxsZJm_q0akRNaPZQIcd2GtPYjhKnap8qQhtp2tSiUcRf5mfsbCjjiafEOeV0utPZ39l3Z0K-NQGi0F4QdFuX-BQ2cdSNESh3I1yacNRv-3NXjaz0WVaHF5NoskX-bGphfJ_QO98cET3qCv197efr6_-bWNznVt78aH7hp9V5age8s4mOQ9euqsOTgSgMN6zD2GBUdnTpaQ6-x8EpfUV2-hgU-mBpnLi6lOvni0q6R14XyG-53idbv1cHZJdt7l47IG_U45E3vj563807cl-YfKpECag1qQHjN_A1AilG5MCMKkwl3Y4TmBQkA1pVQiX5FMQkkwlS9BCqOqks1VbSHAnawNjktRLAMqqHogJeu-wIYA-PojQMDfQdqOYgcsFsaTRy5mIsmQB3ZccQbCagosjDGpAKfxnj2DrDAqN1JTgkU-AyTUUptEU5ERpLt7VlnZxWqEKUPvkC5SyodpP7e_I1FZZlXVTZ7MlCs1H5XL-9D2R7uVouDgm0zVUY9XuXiOKacHEWIDqK27idB_PwtI1-zo_I8UucPr5MPiG7mVX5LJd69Im8fejB6JJNjsn2-u_t4jPihXXzxZv5H2hDsYM
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=POLYMER+RESIN+FOR+UNDERFILL+COMPOSITION+OF+IC+ASSEMBLY+EXHIBITING+SUBSTANTIALLY+NO+VOLUME+CHANGES+DURING+CURING+PROCESS%2C+AND+ELECTRONIC+DEVICE+USING+THE+SAME+TO+IMPROVE+STRESS+CAUSED+BY+DIFFERENT+COEFFICIENT+OF+TEMPERATURE+EXPANSION&rft.inventor=LAMOLA+ANGELO&rft.inventor=BRESE+NATHANIEL+E&rft.date=2004-10-12&rft.externalDBID=A&rft.externalDocID=KR20040086810A