SYSTEM AND METHOD OF MEASURING LOW IMPEDANCE OF POWER LOOP

• Main Authors: HOUGHTON CHRISTOPHER L, KANTOROVICH ISAAC, ST. LAURENT JAMES J
• Format: Patent
• Language: English; Korean
• Published: 28.04.2004
• Edition: 7
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PURPOSE: A system and a method of measuring a low impedance are provided to measure the low impedance of a power loop over a wide bandwidth at various points on a semiconductor die, an electronic chip packaging, and a printed circuit board. CONSTITUTION: A microprocessor is maintained in a reset mod...