Inspection apparatus of roll defect and roll precision using ultrasonic defectoscope

• Main Authors: NAM, GI YONG, CHOI, BYEONG SU
• Format: Patent
• Language: English; Korean
• Published: 07.01.2004
• Edition: 7
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PURPOSE: An apparatus for inspecting and measuring defect of an ultrasonic wave probe is provided to precisely detect the defect of the ultrasonic wave probe by integrally forming a test sample roller with the ultrasonic wave probe. CONSTITUTION: An ultrasonic wave probe(100) is installed on the cen...