SCHOTTKY BARRIER DIODE AND METHOD OF FABRICATING THE SAME

PURPOSE: To solve the problem that a chip cannot be miniaturized smoothly due to mesa etching and a thick polyimide layer and characteristics cannot be improved due to the distance between electrodes in a Schottky barrier diode, and etching at a Schottky junction section cannot be controlled easily...

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Main Authors ASANO TETSURO, ONODA KATSUAKI, ISHIHARA HIDETOSHI, NAKAJIMA YOSHIBUMI, TOMINAGA HISAAKI, HIRATA KOICHI, SAKAKIBARA MIKITO, MURAI SHIGEYUKI
Format Patent
LanguageEnglish
Korean
Published 06.03.2003
Edition7
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Abstract PURPOSE: To solve the problem that a chip cannot be miniaturized smoothly due to mesa etching and a thick polyimide layer and characteristics cannot be improved due to the distance between electrodes in a Schottky barrier diode, and etching at a Schottky junction section cannot be controlled easily in a manufacturing method of a Schottky barrier diode. CONSTITUTION: N- and n+-type ion implanted regions are provided on a substrate surface as an operation region, thus eliminating the need for mesa and a polyimide layer, and achieving the planar type Schottky barrier diode of a compound semiconductor. The costs of a wafer can also be reduced, and the distance between electrodes can be reduced, thus shrinking the chip, and improving high-frequency characteristics. Additionally, GaAs is not etched when a Schottky junction region is formed, thus manufacturing a Schottky barrier diode having excellent reproducibility. 종래, 메사 에칭이나 두꺼운 폴리이미드층 등이 있기 때문에, 칩의 소형화가 실현되지 않고, 전극간에 거리가 있어 특성을 향상할 수 없었다. 또한, 제조 방법에서는 쇼트키 접합 부분의 에칭의 컨트롤이 곤란하였다. 기판 표면에 n형 및 n형 이온 주입 영역을 형성하여 동작 영역으로 함으로써, 메사 및 폴리이미드층을 형성할 필요가 없어져, 화합물 반도체의 플래너형 쇼트키 배리어 다이오드를 실현할 수 있다. 웨이퍼의 비용도 저감되며, 전극간 거리를 접근시킬 수 있으므로 칩의 축소가 실현되고, 고주파 특성도 향상된다. 또한, 쇼트키 전극 형성시에는 GaAs를 에칭하지 않으므로, 재현성이 좋은 쇼트키 배리어 다이오드를 제조할 수 있다.
AbstractList PURPOSE: To solve the problem that a chip cannot be miniaturized smoothly due to mesa etching and a thick polyimide layer and characteristics cannot be improved due to the distance between electrodes in a Schottky barrier diode, and etching at a Schottky junction section cannot be controlled easily in a manufacturing method of a Schottky barrier diode. CONSTITUTION: N- and n+-type ion implanted regions are provided on a substrate surface as an operation region, thus eliminating the need for mesa and a polyimide layer, and achieving the planar type Schottky barrier diode of a compound semiconductor. The costs of a wafer can also be reduced, and the distance between electrodes can be reduced, thus shrinking the chip, and improving high-frequency characteristics. Additionally, GaAs is not etched when a Schottky junction region is formed, thus manufacturing a Schottky barrier diode having excellent reproducibility. 종래, 메사 에칭이나 두꺼운 폴리이미드층 등이 있기 때문에, 칩의 소형화가 실현되지 않고, 전극간에 거리가 있어 특성을 향상할 수 없었다. 또한, 제조 방법에서는 쇼트키 접합 부분의 에칭의 컨트롤이 곤란하였다. 기판 표면에 n형 및 n형 이온 주입 영역을 형성하여 동작 영역으로 함으로써, 메사 및 폴리이미드층을 형성할 필요가 없어져, 화합물 반도체의 플래너형 쇼트키 배리어 다이오드를 실현할 수 있다. 웨이퍼의 비용도 저감되며, 전극간 거리를 접근시킬 수 있으므로 칩의 축소가 실현되고, 고주파 특성도 향상된다. 또한, 쇼트키 전극 형성시에는 GaAs를 에칭하지 않으므로, 재현성이 좋은 쇼트키 배리어 다이오드를 제조할 수 있다.
Author ASANO TETSURO
NAKAJIMA YOSHIBUMI
SAKAKIBARA MIKITO
TOMINAGA HISAAKI
HIRATA KOICHI
ISHIHARA HIDETOSHI
MURAI SHIGEYUKI
ONODA KATSUAKI
Author_xml – fullname: ASANO TETSURO
– fullname: ONODA KATSUAKI
– fullname: ISHIHARA HIDETOSHI
– fullname: NAKAJIMA YOSHIBUMI
– fullname: TOMINAGA HISAAKI
– fullname: HIRATA KOICHI
– fullname: SAKAKIBARA MIKITO
– fullname: MURAI SHIGEYUKI
BookMark eNrjYmDJy89L5WSwDHb28A8J8Y5UcHIMCvJ0DVJw8fR3cVVw9HNR8HUN8fB3UfB3U3BzdArydHYM8fRzVwjxcFUIdvR15WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BRgYGxgYGhpaGlmaOxsSpAgANNyrn
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
DocumentTitleAlternate 쇼트키 배리어 다이오드 및 그 제조 방법
Edition 7
ExternalDocumentID KR20030019196A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20030019196A3
IEDL.DBID EVB
IngestDate Fri Jul 19 16:06:15 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Korean
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20030019196A3
Notes Application Number: KR20020051403
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030306&DB=EPODOC&CC=KR&NR=20030019196A
ParticipantIDs epo_espacenet_KR20030019196A
PublicationCentury 2000
PublicationDate 20030306
PublicationDateYYYYMMDD 2003-03-06
PublicationDate_xml – month: 03
  year: 2003
  text: 20030306
  day: 06
PublicationDecade 2000
PublicationYear 2003
RelatedCompanies SANYO ELECTRIC CO., LTD
RelatedCompanies_xml – name: SANYO ELECTRIC CO., LTD
Score 2.5518055
Snippet PURPOSE: To solve the problem that a chip cannot be miniaturized smoothly due to mesa etching and a thick polyimide layer and characteristics cannot be...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title SCHOTTKY BARRIER DIODE AND METHOD OF FABRICATING THE SAME
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030306&DB=EPODOC&locale=&CC=KR&NR=20030019196A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_mFPVNp-LHlIDSt-K6pKN9GNI2qZ2j7YhV5tNYugZE2Yar-O-bZpvuaW8hB8cl5Je7S-4D4G7iYiHJWJit3CbKQbEtc4ydjimstiVzi0yW0YRx0oleyNPQHtbgc50Lo-uE_ujiiApRucJ7qe_r-f8jFtWxlYt78a6mZg9h1qXG2jvGlQlsUL_LBilNAyMIun1uJHxJU-aMOnDeDuxWhnRVaZ-9-lVeynxTqYRHsDdQ_KblMdQ-Zg04CNa91xqwH6--vNVwhb7FCbhVb4ws678h3-O8xziivZQy5CUUxSyLUorSEIWez3V6cPKIsoihZy9mp3AbsiyITCXD6G_Joz7fFBifQX06mxbngGRBJHYK1y4mktgEC7clFews2cbCdhx8Ac1tnC63k6_gUAer6Q6DTaiXX9_FtVK6pbjRe_ULGCx-WQ
link.rule.ids 230,309,786,891,25594,76906
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gGvFNUeMHahPN3hYZ7XB7IGZbO4djG5nT6BOhsCZGA0Rm_PftCihPvDW95HJt-uvdtfcBcDO2MRdkyPXmyCTSQTENfYitts6NliFGBhkvogmjuB08k8dX87UCn6tcGFUn9EcVR5SIGkm8F-q-nv0_YlEVWzm_5e9yanrvZx2qrbxjXJrAGnU7rJ_QxNM8rxOmWpwuaNKckQfO2YLtu7I-b2k8vbhlXspsXan4-7DTl_wmxQFUPqZ1qHmr3mt12I2WX95yuETf_BDssjdGloVvyHXStMtSRLsJZciJKYpYFiQUJT7yHTdV6cHxA8oChp6ciB3Btc8yL9ClDIO_JQ_CdF1gfAzVyXSSnwASORHYym0zHwtiEsztppCwM0QLc9Oy8Ck0NnE620y-glqQRb1BrxuH57CnAtdUt8EGVIuv7_xCKuCCX6p9-wUpY4FG
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SCHOTTKY+BARRIER+DIODE+AND+METHOD+OF+FABRICATING+THE+SAME&rft.inventor=ASANO+TETSURO&rft.inventor=ONODA+KATSUAKI&rft.inventor=ISHIHARA+HIDETOSHI&rft.inventor=NAKAJIMA+YOSHIBUMI&rft.inventor=TOMINAGA+HISAAKI&rft.inventor=HIRATA+KOICHI&rft.inventor=SAKAKIBARA+MIKITO&rft.inventor=MURAI+SHIGEYUKI&rft.date=2003-03-06&rft.externalDBID=A&rft.externalDocID=KR20030019196A