Novel Tetrahydrofuran Compounds Having Alicyclic Structure
PURPOSE: To provide a tetrahydrofuran compound which, when polymerized, gives a polymer used for preparing a resist material which is sensitive to a high-energy ray, excellent in sensitivity, resolution, and etching resistance, and useful for fine processing, especially a resist material which hardl...
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Format | Patent |
Language | English Korean |
Published |
19.10.2002
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Edition | 7 |
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Abstract | PURPOSE: To provide a tetrahydrofuran compound which, when polymerized, gives a polymer used for preparing a resist material which is sensitive to a high-energy ray, excellent in sensitivity, resolution, and etching resistance, and useful for fine processing, especially a resist material which hardly absorbs light of an ArF excimer laser or a KrF excimer laser, is excellent in adhesion to a substrate, hence can easily form a minute pattern vertical to the substrate, and is suitable as a minute-pattern forming material for producing a VLSI. CONSTITUTION: This tetrahydrofuran compound is represented by formula (1) (wherein the broken line indicates a single bond, a divalent organic group or a structure wherein a tetrahydrofuran structure and an alicyclic structure being norbornene or tetracyclo£4.4.0.1¬2,¬5.1¬7,¬10|dodecene jointly have one or two constituting carbon atoms; and k is 0 or 1).
본 발명은 하기 화학식 1로 표시되는 테트라히드로푸란 화합물에 관한 것이다. 또한, 본 발명의 테트라히드로푸란 화합물을 중합함으로써 얻어지는 중합체를 사용하여 제조된 레지스트 재료는 고에너지선에 감응하고, 감도, 해상성, 에칭 내성이 우수하여 전자선 및 원자외선에 의한 미세 가공에 유용하다. 특히, ArF 엑시머 레이저, KrF 엑시머 레이저의 노광 파장에서의 흡수가 작고, 동시에 기판 밀착성이 우수하기 때문에 미세하면서 나아가 기판에 대하여 수직인 패턴을 쉽게 형성할 수 있어 초 LSI 제조용의 미세 패턴 형성 재료로서 바람직하다. 식 중, 점선은 단결합 또는 2가의 유기기를 나타내거나, 또는 노르보르넨 또는 테트라시클로[4.4.0.1.1]도데센인 지환 구조와 테트라히드로푸란환 구조가 1개 또는 2개의 구성 탄소 원자를 공유하는 구조를 나타내며, k는 0 또는 1이다. |
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AbstractList | PURPOSE: To provide a tetrahydrofuran compound which, when polymerized, gives a polymer used for preparing a resist material which is sensitive to a high-energy ray, excellent in sensitivity, resolution, and etching resistance, and useful for fine processing, especially a resist material which hardly absorbs light of an ArF excimer laser or a KrF excimer laser, is excellent in adhesion to a substrate, hence can easily form a minute pattern vertical to the substrate, and is suitable as a minute-pattern forming material for producing a VLSI. CONSTITUTION: This tetrahydrofuran compound is represented by formula (1) (wherein the broken line indicates a single bond, a divalent organic group or a structure wherein a tetrahydrofuran structure and an alicyclic structure being norbornene or tetracyclo£4.4.0.1¬2,¬5.1¬7,¬10|dodecene jointly have one or two constituting carbon atoms; and k is 0 or 1).
본 발명은 하기 화학식 1로 표시되는 테트라히드로푸란 화합물에 관한 것이다. 또한, 본 발명의 테트라히드로푸란 화합물을 중합함으로써 얻어지는 중합체를 사용하여 제조된 레지스트 재료는 고에너지선에 감응하고, 감도, 해상성, 에칭 내성이 우수하여 전자선 및 원자외선에 의한 미세 가공에 유용하다. 특히, ArF 엑시머 레이저, KrF 엑시머 레이저의 노광 파장에서의 흡수가 작고, 동시에 기판 밀착성이 우수하기 때문에 미세하면서 나아가 기판에 대하여 수직인 패턴을 쉽게 형성할 수 있어 초 LSI 제조용의 미세 패턴 형성 재료로서 바람직하다. 식 중, 점선은 단결합 또는 2가의 유기기를 나타내거나, 또는 노르보르넨 또는 테트라시클로[4.4.0.1.1]도데센인 지환 구조와 테트라히드로푸란환 구조가 1개 또는 2개의 구성 탄소 원자를 공유하는 구조를 나타내며, k는 0 또는 1이다. |
Author | WATANABE TAKERU KINSHO TAKESHI HASEGAWA KOJI |
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DocumentTitleAlternate | 지환 구조를 포함하는 신규 테트라히드로푸란 화합물 |
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Snippet | PURPOSE: To provide a tetrahydrofuran compound which, when polymerized, gives a polymer used for preparing a resist material which is sensitive to a... |
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SubjectTerms | APPARATUS SPECIALLY ADAPTED THEREFOR CHEMISTRY CINEMATOGRAPHY COMPOSITIONS BASED THEREON ELECTROGRAPHY HETEROCYCLIC COMPOUNDS HOLOGRAPHY MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVINGCARBON-TO-CARBON UNSATURATED BONDS MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONSONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS MATERIALS THEREFOR METALLURGY ORGANIC CHEMISTRY ORGANIC MACROMOLECULAR COMPOUNDS ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS THEIR PREPARATION OR CHEMICAL WORKING-UP |
Title | Novel Tetrahydrofuran Compounds Having Alicyclic Structure |
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