SDH CROSS CONNECT SWITCH MATRIX CONNECTION TESTING CIRCUITS

Saved in:
Bibliographic Details
Main Authors KO, JE-SOO, KIM, JAE-KEUN, KIM, HOON, CHOE, SUNG-HYUK
Format Patent
LanguageEnglish
Published 15.09.1998
Edition6
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
Online AccessGet full text

Cover

Author CHOE, SUNG-HYUK
KIM, HOON
KIM, JAE-KEUN
KO, JE-SOO
Author_xml – fullname: KO, JE-SOO
– fullname: KIM, JAE-KEUN
– fullname: KIM, HOON
– fullname: CHOE, SUNG-HYUK
BookMark eNrjYmDJy89L5WSwDnbxUHAO8g8OVnD29_NzdQ5RCA73DHH2UPB1DAnyjICJevr7KYS4Bod4-rkrOHsGOYd6hgTzMLCmJeYUp_JCaW4GRTdXoFbd1IL8-NTigsTk1LzUknjvIANDE3MDIzMnJ0NjYtQAAAbYK3Y
ContentType Patent
DBID EVB
DatabaseName esp@cenet
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
Edition 6
ExternalDocumentID KR0147026BB1
GroupedDBID EVB
ID FETCH-epo_espacenet_KR0147026BB13
IEDL.DBID EVB
IngestDate Fri Jul 19 16:18:12 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR0147026BB13
Notes Application Number: KR19940036960
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19980915&DB=EPODOC&CC=KR&NR=0147026B1
ParticipantIDs epo_espacenet_KR0147026BB1
PublicationCentury 1900
PublicationDate 19980915
PublicationDateYYYYMMDD 1998-09-15
PublicationDate_xml – month: 09
  year: 1998
  text: 19980915
  day: 15
PublicationDecade 1990
PublicationYear 1998
RelatedCompanies KOREA ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE
KOREA TELECOM CORP
RelatedCompanies_xml – name: KOREA ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE
– name: KOREA TELECOM CORP
Score 2.492917
SourceID epo
SourceType Open Access Repository
SubjectTerms CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
Title SDH CROSS CONNECT SWITCH MATRIX CONNECTION TESTING CIRCUITS
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19980915&DB=EPODOC&locale=&CC=KR&NR=0147026B1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bT4MwFD5Z5vVNp2bOS2pieCOOjYvEECMFBBdggU73tsCEZC9scRj_vqd1qC_6eto0bZPvfD2n_U4BrocqJ0ZFk_OCZ6v6RSbnGuJxWKpZaQiK4drhMNL9ifo01aYtWDRaGFEn9EMUR0REzRHvtfDXq58kliPeVq5v8gWalvcesxzptZGLIf1pkmNb7jh2YipRao0SKUp44szAcMPGQGmLn6J5mX332eailNVvRvEOYHuMg1X1IbSKqgN7tPl4rQO74ea-uwM74oHmfI3GDQjXR3CXOj6hSZymhMZR5FJG0peAUZ-EDywJpo0VvSRhbsqC6JHQIKGTgKXHcOW52FXG-cy-1z4bJc3MbWV4Au1qWRVdIGaW9zOEqjI3CpX_noFxUDkwjDIzBvqtqZ9C7-9xev81nsH-l-zOlBXtHNr123txgbxb55dixz4B9PKAOQ
link.rule.ids 230,309,786,891,25594,76904
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3fT8IwEL4Q_IFvihrFXzUxe1tksFGJIcZ1w03YRrYivJENt4SXQWTGf99rZeqLvl6by7XJ1y937XcFuGnrghg1Q01SUa1qprGaGIjHdqbHGZUUI7TDnt9xxvrz1JhWYFFqYWSf0A_ZHBERNUe8F_K8Xv0UsSz5tnJ9myzQtHzo856lvJZyMaQ_Q7HMnj0KrIApjPUGoeKHonBGMd0wMVHaopgRijb79ospRCmr34zS34ftETrLiwOopHkdaqz8eK0Ou97mvrsOO_KB5nyNxg0I14dwH1kOYWEQRYQFvm8zTqKJy5lDvEceutPSiqck4XbEXf-JMDdkY5dHR3Ddt3GqivHMvtc-G4Rl5KbWPoZqvszTEyDdOGnGCFVtTlNd_J6BeVDWojSLaatz1-2cQuNvP43_Bq-g5nBvOBu6_uAM9r4keF1VM86hWry9pxfIwUVyKXfvExjwgyQ
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SDH+CROSS+CONNECT+SWITCH+MATRIX+CONNECTION+TESTING+CIRCUITS&rft.inventor=KO%2C+JE-SOO&rft.inventor=KIM%2C+JAE-KEUN&rft.inventor=KIM%2C+HOON&rft.inventor=CHOE%2C+SUNG-HYUK&rft.date=1998-09-15&rft.externalDBID=B1&rft.externalDocID=KR0147026BB1