MEASURING INSTRUMENT OF INTERVAL BETWEEN IDENTIFICATION MARKS

• Main Authors: AYADA NAOKI, KUROKI YOUICHI, HAMAZAKI FUMIYOSHI, MATSUMURA TAKASHI
• Format: Patent
• Language: English
• Published: 12.12.1985
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

PURPOSE:To enable more precise and stable measurement of the interval of identification marks by the means of detecting the signal position transmitted from the 1st identification mark and of setting uniformly the necessary timing for detecting the 2nd signal on that basis. CONSTITUTION:The value fo...