IRRADIATION SYSTEM FOR ELECTRON RAY DEVICE
PURPOSE:To image an electron probe of minute diameter without performing any complicate control or operation by locating the final stage lens of four focusing lenses near a front objective and adjusting the synthetic reduction rate to below a given level. CONSTITUTION:Four focusing lenses (C1-C4) ar...
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Main Author | |
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Format | Patent |
Language | English |
Published |
29.07.1985
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Subjects | |
Online Access | Get full text |
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